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pro vyhledávání: '"Wook Hi Yoon"'
Publikováno v:
Japanese Journal of Applied Physics. 41:28-31
A series of ZnO films with various thicknesses were prepared on (0001) sapphire substrate by pulsed laser deposition (PLD). Scanning electron microscopy (SEM) and x-ray diffraction (XRD) analysis were utilized to investigate the effects of thickness
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::da3dfb36db16aa734ebd5471fb690878
https://doi.org/10.1143/jjap.41.28
https://doi.org/10.1143/jjap.41.28
