Zobrazeno 1 - 5
of 5
pro vyhledávání: '"WooYeong Cho"'
Autor:
Magauiya Zhussip, Julien Mairal, Ziwei Luo, Christian Micheloni, Haoqiang Fan, Sanghyeok Son, Jean Ponce, Rao Muhammad, Ziluan Liu, Kazutoshi Akita, Xuan Mo, Umer Youliang Yan, Pavel Ostyakov, Youwei Li, Martin Danelljan, Norimichi Ukita, Bruno Lecouat, Lei Yu, Xueyi Zou, Goutam Bhat, Radu Timofte, Shuaicheng Liu, Dae-Shik Kim, Jian Sun, Lanpeng Jia, Wooyeong Cho, Takahiro Maeda, Takeru Oba
Publikováno v:
CVPR Workshops
This paper reviews the NTIRE2021 challenge on burst super-resolution. Given a RAW noisy burst as input, the task in the challenge was to generate a clean RGB image with 4 times higher resolution. The challenge contained two tracks; Track 1 evaluating
Publikováno v:
CVPR Workshops
Burst image super-resolution is an ill-posed problem that aims to restore a high-resolution (HR) image from a sequence of low-resolution (LR) burst images. To restore a photo-realistic HR image using their abundant information, it is essential to ali
Publikováno v:
Natural Language Processing and Information Systems ISBN: 9783030805982
NLDB
NLDB
Recent research fields tackle high-level machine learning tasks which often deal with multiplex datasets. Image-text multimodal learning is one of the comparatively challenging domains in Natural Language Processing. In this paper, we suggest a novel
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2573a20f1a91f8424397061e8bdc7e8a
https://doi.org/10.1007/978-3-030-80599-9_30
https://doi.org/10.1007/978-3-030-80599-9_30
Autor:
O Seongil, Minchul Sung, Mohammad Alian, Suk-Han Lee, Reum Oh, Wooyeong Cho, Ki-Won Lee, Chan-kyung Kim, Jung Ho Ahn, Nam Sung Kim
Publikováno v:
PACT
The advance of DRAM manufacturing technology slows down, whereas the density and performance needs of DRAM continue to increase. This desire has motivated the industry to explore emerging Non-Volatile Memory (e.g., 3D XPoint) and the high-density DRA
Autor:
Sangbeom Kang, WooYeong Cho, Beak-Hyung Cho, Kwang-Jin Lee, Chang-Soo Lee, Hyung-Rock Oh, Byung-Gil Choi, Qi Wang, Hye-Jin Kim, Mu-Hui Park, Yu-Hwan Ro, Suyeon Kim, Du-Eung Kim, Kang-Sik Cho, Choong-Duk Ha, Youngran Kim, Ki-Sung Kim, Choong-Ryeol Hwang, Choong-Keun Kwak, Hyun-Geun Byun
Publikováno v:
2006 IEEE International Solid State Circuits Conference - Digest of Technical Papers; 2006, p487-496, 10p