Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Wonju Sung"'
Publikováno v:
IEEE Access, Vol 12, Pp 139427-139434 (2024)
The challenges associated with semiconductor are increasing because of the rapid changes in the semiconductor market and the extreme scaling of semiconductors, with some processes reaching their technological limits. In the case of gate dielectrics,
Externí odkaz:
https://doaj.org/article/e56a0bc5646e40389047d36e9136ccd7
Autor:
Daewoong Lee, Jaehyeok Baek, Hye-Jung Kwon, Dae-Hyun Kwon, Chulhee Cho, Sang-Hoon Kim, Donggun An, Chulsoon Chang, Unhak Lim, Jiyeon Im, Wonju Sung, Hye-Ran Kim, Sun-Young Park, Hyoung-Joo Kim, Hoseok Seol, Juhwan Kim, Jungbum Shin, Gil-Young Kang, Yong-Hun Kim, Sooyoung Kim, Wansoo Park, Seok-Jung Kim, Chan-Yong Lee, Seungseob Lee, Tae-Hoon Park, Chi-Sung Oh, Hyodong Ban, Hyungjong Ko, Hoyoung Song, Tae-Young Oh, Sang-Joon Hwang, Kyung-Suk Oh, Jung-Hwan Choi, Jooyoung Lee
Publikováno v:
IEEE Journal of Solid-State Circuits. 58:279-290
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bbc580599e1edb34dc63017fb2dcf4b9
https://doi.org/10.1109/jssc.2022.3222203
https://doi.org/10.1109/jssc.2022.3222203
Autor:
Daewoong Lee, Hye-Jung Kwon, Daehyun Kwon, Jaehyeok Baek, Chulhee Cho, Sanghoon Kim, Donggun An, Chulsoon Chang, Unhak Lim, Jiyeon Im, Wonju Sung, Hye-Ran Kim, Sun-Young Park, HyoungJoo Kim, Hoseok Seol, Juhwan Kim, Junabum Shin, Kil-Youna Kang, Yona-Hun Kim, Sooyoung Kim, Wansoo Park, Seok-Jung Kim, Chanyong Lee, Seungseob Lee, TaeHoon Park, ChiSung Oh, Hyodong Ban, Hyungjong Ko, Hoyoung Song, Tae-Young Oh, SangJoon Hwang, Kyung Suk Oh, JungHwan Choi, Jooyoung Lee
Publikováno v:
2022 IEEE International Solid- State Circuits Conference (ISSCC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::604f4ea45799b4ec9e0007b0da8cba01
https://doi.org/10.1109/isscc42614.2022.9731614
https://doi.org/10.1109/isscc42614.2022.9731614