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pro vyhledávání: '"Wong, Connor"'
Autor:
Wong, Connor
Focused Ion Beam (FIB) technology is a versatile tool that can be applied in many fields to great effect, including semiconductor device prototyping, Transmission Electron Microscopy (TEM) sample preparation, and nanoscale tomography. Developments in
Externí odkaz:
http://hdl.handle.net/11375/25804
Autor:
Reyes-Gonzalez, Joaquin E, Lee, Ka Y, Wong, Connor, Bassim, Nabil D, Rez, Peter, Lagos, Maureen J
Publikováno v:
Microscopy & Microanalysis; 2024 Supplement, Vol. 30, p1-3, 3p
Autor:
Lagos, Maureen J., Wong, Connor, Yeh, Yao-Wen, Bicket, Isobel C., Agboola, Babafemi S., Bassim, Nabil D.
Publikováno v:
Microscopy & Microanalysis; 2022 Supplement, Vol. 28, p1966-1968, 3p
Publikováno v:
Microscopy & Microanalysis; 2021 Supplement 1, Vol. 27, p702-704, 3p
Autor:
Wong, Connor
Publikováno v:
36th International Electronics Manufacturing Technology Conference; 2014, p1-4, 4p