Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Won-nyoung Jeong"'
Autor:
Si-Jun Kim, Min-Su Choi, Sang-Ho Lee, Won-Nyoung Jeong, Young-Seok Lee, In-Ho Seong, Chul-Hee Cho, Dae-Woong Kim, Shin-Jae You
Publikováno v:
Sensors, Vol 23, Iss 5, p 2521 (2023)
The importance of monitoring the electron density uniformity of plasma has attracted significant attention in material processing, with the goal of improving production yield. This paper presents a non-invasive microwave probe for in-situ monitoring
Externí odkaz:
https://doaj.org/article/529c4a8337e847e3ba60023453870fb4
Publikováno v:
Nanomaterials, Vol 12, Iss 24, p 4457 (2022)
SiO2 etching characteristics were investigated in detail. Patterned SiO2 was etched using radio-frequency capacitively coupled plasma with pulse modulation in a mixture of argon and fluorocarbon gases. Through plasma diagnostic techniques, plasma par
Externí odkaz:
https://doaj.org/article/2884197c289e476d8ad4d03186fff46e
Autor:
Ye-Bin You, Young-Seok Lee, Si-Jun Kim, Chul-Hee Cho, In-Ho Seong, Won-Nyoung Jeong, Min-Su Choi, Shin-Jae You
Publikováno v:
Nanomaterials, Vol 12, Iss 21, p 3798 (2022)
One of the cleaning processes in semiconductor fabrication is the ashing process using oxygen plasma, which has been normally used N2 gas as additive gas to increase the ashing rate, and it is known that the ashing rate is strongly related to the con
Externí odkaz:
https://doaj.org/article/045575d698d647b4aec66124a4abaf1e
Autor:
Si-jun Kim, In-ho Seong, Young-seok Lee, Chul-hee Cho, Won-nyoung Jeong, Ye-bin You, Jang-jae Lee, Shin-jae You
Publikováno v:
Sensors, Vol 22, Iss 15, p 5871 (2022)
As the conventional voltage and current (VI) probes widely used in plasma diagnostics have separate voltage and current sensors, crosstalk between the sensors leads to degradation of measurement linearity, which is related to practical accuracy. Here
Externí odkaz:
https://doaj.org/article/932ea57d62c34382adf6f1854152c408
Autor:
Min-Su Choi, Si-Jun Kim, Young-Seok Lee, Chul-Hee Cho, In-Ho Seong, Won-Nyoung Jeong, Ye-Bin You, Byoung-Yeop Choi, You-Bin Seol, Shin Jae You
Publikováno v:
Applied Science and Convergence Technology. 32:54-57
Autor:
Ye-Bin You, Si-Jun Kim, Young-Seok Lee, Chul-Hee Cho, In-Ho Seong, Won-Nyoung Jeong, Min-Su Choi, Byoung-Yeop Choi, Shin-Jae You
Publikováno v:
Applied Science and Convergence Technology. 31:103-106
Publikováno v:
Nanomaterials (Basel, Switzerland). 12(24)
SiO
Autor:
Choi Min Su, Lee Sangho, Won Nyoung Jeong, Cho, Churl-hee, Si Jun Kim, You, ShinJae, seonginho, Youngseok Lee, R. Navamathavan
Publikováno v:
Applied Science and Convergence Technology. 29:170-175