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Publikováno v:
Journal of the Korean Physical Society. 77:829-835
With the development of technology, semiconductor components are now being used in many parts of IT components and solar modules. Because of the features of these products, a device for inspecting the manufactured products is needed. In this paper, w
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::14124ec8cc1f1b3bbd8fa7a21bc9ce5b
https://doi.org/10.3938/jkps.77.829
https://doi.org/10.3938/jkps.77.829
