Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Wolfgang Joachimi"'
Publikováno v:
International Symposium for Testing and Failure Analysis.
This work presents advanced resistance mapping techniques based on Scanning Electron Microscopy (SEM) with nanoprobing systems and the related embedded electronics. Focus is placed on recent advances to reduce noise and increase speed, such as integr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::504549fd1abbd3d00d4498c24c4eb4a8
https://doi.org/10.31399/asm.cp.istfa2018p0353
https://doi.org/10.31399/asm.cp.istfa2018p0353
Autor:
Mark T. Greiner, Ali Rinaldi, Xing Huang, Zhu-Jun Wang, Grigore Moldovan, Robert Schlögl, Wolfgang Joachimi, Marc Georg Willinger, Jing Cao
Publikováno v:
Microscopy Microanalysis Microstructures
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::49a82c03b8a642ffa81d161396473251
https://doi.org/10.1017/s1431927618002210
https://doi.org/10.1017/s1431927618002210
Publikováno v:
Microscopy and Microanalysis. 24:654-655
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::460a637bbec18b556b13e1734f819295
https://doi.org/10.1017/s1431927618003768
https://doi.org/10.1017/s1431927618003768
Autor:
Matthias Hemmleb, Marc Georg Willinger, Grigore Moldovan, Wolfgang Joachimi, Uwe Grauel, Zhu-Jun Wang
Publikováno v:
Microscopy and Microanalysis. 24:694-695
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::48774e65d97c317e9b0f99568c7a68cc
https://doi.org/10.1017/s1431927618003963
https://doi.org/10.1017/s1431927618003963
Publikováno v:
European Microscopy Congress 2016: Proceedings
Electron Beam Absorbed Current (EBAC) is a specimen current imaging technique that has been established in the earliest stages of Scanning Electron Microscopy (SEM), but which has been somewhat overlooked for last few decades [1], with the exception
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::249a16f1eb58b4cab01a179e954a7788
https://doi.org/10.1002/9783527808465.emc2016.5830
https://doi.org/10.1002/9783527808465.emc2016.5830
