Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Wolfgang Fröhlich"'
Autor:
Karl-Erich Lindenschmidt, Dirk Carstensen, Wolfgang Fröhlich, Bernd Hentschel, Stefan Iwicki, Michael Kögel, Michał Kubicki, Zbigniew W. Kundzewicz, Cornelia Lauschke, Adam Łazarów, Helena Łoś, Włodzimierz Marszelewski, Tomasz Niedzielski, Marcin Nowak, Bogusław Pawłowski, Michael Roers, Stefan Schlaffer, Beata Weintrit
Publikováno v:
Water, Vol 11, Iss 1, p 95 (2019)
Despite ubiquitous warming, the lower Oder River typically freezes over almost every year. Ice jams may occur during freeze-up and ice cover breakup phases, particularly in the middle and lower reaches of the river, with weirs and piers. The slush ic
Externí odkaz:
https://doaj.org/article/757973a48073462aacf7918be54d4684
Autor:
Bogusław Pawłowski, Michael Kögel, Marcin Nowak, Stefan Iwicki, Zbigniew W. Kundzewicz, Karl-Erich Lindenschmidt, Beata Weintrit, Włodzimierz Marszelewski, Helena Łoś, Tomasz Niedzielski, Michael Roers, Wolfgang Fröhlich, Adam Łazarów, Cornelia Lauschke, Michał Kubicki, Stefan Schlaffer, Dirk Carstensen, Bernd Hentschel
Publikováno v:
Water, Vol 11, Iss 1, p 95 (2019)
Despite ubiquitous warming, the lower Oder River typically freezes over almost every year. Ice jams may occur during freeze-up and ice cover breakup phases, particularly in the middle and lower reaches of the river, with weirs and piers. The slush ic
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9264aa8a208ac32f8f101c9ec97c5158
https://elib.dlr.de/125629/
https://elib.dlr.de/125629/
Autor:
Berthold Hellenthal, Wolfgang Fröhlich
Publikováno v:
ATZelektronik. 10:56-61
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4f64b97544b9632e39a4f41c6d30825e
https://doi.org/10.1007/s35658-015-0566-1
https://doi.org/10.1007/s35658-015-0566-1
Autor:
Berthold Hellenthal, Wolfgang Fröhlich
Publikováno v:
ATZelektronik worldwide. 10:36-39
Audi’s semiconductor strategy – the Progressive SemiConductor Program (PSCP) – focuses in the area of “Robust Semiconductors” on the challenge of increasing the reliability of semiconductors in their automotive applications methodically and
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3884f7255ef1b8b98ce5051d74a8f532
https://doi.org/10.1007/s38314-015-0541-x
https://doi.org/10.1007/s38314-015-0541-x
Autor:
Roland Ekerdt, Bernd Buchmann, Claudia Giesen, Wolfgang Fröhlich, Josef Heindl, Werner Skuballa
Publikováno v:
Journal of Dermatological Science. 16:S211
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::767ed6d8de71fcbc2a565f37b8fe76b5
https://doi.org/10.1016/s0923-1811(98)84263-1
https://doi.org/10.1016/s0923-1811(98)84263-1
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