Zobrazeno 1 - 10
of 317
pro vyhledávání: '"Witters, L A"'
Autor:
Yamaguchi, S., Witters, L., Mitard, J., Eneman, G., Hellings, G., Hikavyy, A., Loo, R., Horiguchi, N.
Publikováno v:
In Microelectronics Reliability April 2018 83:157-161
Autor:
Aoulaiche, M., Simoen, E., Caillat, C., Witters, L., Bourdelle, K.K., Nguyen, B.-Y., Martino, J., Claeys, C., Fazan, P., Jurczak, M.
Publikováno v:
In Solid State Electronics March 2016 117:123-129
Autor:
Collaert, N., Alian, A., Arimura, H., Boccardi, G., Eneman, G., Franco, J., Ivanov, Ts., Lin, D., Loo, R., Merckling, C., Mitard, J., Pourghaderi, M.A., Rooyackers, R., Sioncke, S., Sun, J.W., Vandooren, A., Veloso, A., Verhulst, A., Waldron, N., Witters, L., Zhou, D., Barla, K., Thean, A.V.-Y.
Publikováno v:
In Microelectronic Engineering 25 January 2015 132:218-225
Autor:
Witters, L., Eneman, G., Mitard, J., Vincent, B., Hikavyy, A., Milenin, A.P., Mertens, S., Thean, A., Collaert, N.
Publikováno v:
In Solid State Electronics August 2014 98:7-11
Autor:
Franco, J., Kaczer, B., Toledano-Luque, M., Roussel, Ph.J., Cho, M., Kauerauf, T., Mitard, J., Eneman, G., Witters, L., Grasser, T., Groeseneken, G.
Publikováno v:
In Microelectronic Engineering September 2013 109:250-256
Autor:
Simoen, E., Mitard, J., Hellings, G., Eneman, G., De Jaeger, B., Witters, L., Vincent, B., Loo, R., Delabie, A., Sioncke, S., Caymax, M., Claeys, C.
Publikováno v:
In Materials Science in Semiconductor Processing December 2012 15(6):588-600
Autor:
Hikavyy, A., Vanherle, W., Vincent, B., Dekoster, J., Bender, H., Moussa, A., Witters, L., Hoffman, T., Loo, R.
Publikováno v:
In Thin Solid Films 1 February 2012 520(8):3179-3184
Autor:
Franco, J., Kaczer, B., Toledano-Luque, M., Roussel, Ph. J., Hehenberger, P., Grasser, T., Mitard, J., Eneman, G., Witters, L., Hoffmann, T.Y., Groeseneken, G.
Publikováno v:
In Microelectronic Engineering 2011 88(7):1388-1391
Autor:
Chiarella, T., Witters, L., Mercha, A., Kerner, C., Rakowski, M., Ortolland, C., Ragnarsson, L.-Å., Parvais, B., De Keersgieter, A., Kubicek, S., Redolfi, A., Vrancken, C., Brus, S., Lauwers, A., Absil, P., Biesemans, S., Hoffmann, T.
Publikováno v:
In Solid State Electronics 2010 54(9):855-860
Performance improvement in narrow MuGFETs by gate work function and source/drain implant engineering
Autor:
Ferain, I., Duffy, R., Collaert, N., van Dal, M.J.H., Pawlak, B.J., O’Sullivan, B., Witters, L., Rooyackers, R., Conard, T., Popovici, M., van Elshocht, S., Kaiser, M., Weemaes, R.G.R., Swerts, J., Jurczak, M., Lander, R.J.P., De Meyer, K.
Publikováno v:
In Solid State Electronics 2009 53(7):760-766