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Domino logic designs for high-performance and leakage-tolerant applications

Autor: Moradi, Farshad, Vu Cao, Tuan, Vatajelu, Elena I., Peiravi, Ali, Mahmoodi, Hamid, Wisland, Dag T.

Publikováno v: In Integration, the VLSI Journal June 2013 46(3):247-254

Powerline Communication System-on-Chip in 180 nm Harsh Environment SOI Technology

Autor: Stuckenberg, Tobias, Rucker, Malte, Rother, Niklas, Nowosielski, Rochus, Wiese, Frank, Blume, Holger, Nurmi, Jari, Wisland, Dag T., Aunet, Snorre, Kjelgaard, Kristian

Publikováno v: 2021 IEEE Nordic Circuits and Systems Conference (NorCAS)
NorCAS

Broadband powerline communication systems using Orthogonal Frequency Division Multiplexing (OFDM) can utilize existing power lines to transmit data packets alongside power distribution. Recent standards focus towards high speed multi-media in-house s

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b7642e87ec7b9c2eb1f6810b954f9c77
https://www.repo.uni-hannover.de/handle/123456789/13382

Process Variations in Sub-Threshold SRAM Cells

Autor: Moradi, Farshad, Wisland, Dag T., Berg, Yngvar, Aunet, Snorre, Cao, Tuan Vu

Publikováno v: Moradi, F, Wisland, D T, Berg, Y, Aunet, S & Cao, T V 2010, ' Process Variations in Sub-Threshold SRAM Cells ', Paper presented at International Conference on Microelectronics, Cairo, Egypt, 19/12/2010-22/12/2010 . https://doi.org/10.1109/ICM.2010.5696164

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=pure_au_____::638c0cc5c04502708c5c7087b8b06533
https://pure.au.dk/portal/da/publications/process-variations-in-subthreshold-sram-cells(b7c87054-6685-4986-92f8-ced49e32f73b).html

New subthreshold concepts in 65nm CMOS technology

Autor: Moradi, Farshad, Wisland, Dag T., Mahmoodi, Hamid, Peiravi, Ali, Tuan Vu, Cao

Publikováno v: Moradi, F, Wisland, D T, Mahmoodi, H, Peiravi, A & Tuan Vu, C 2009, ' New subthreshold concepts in 65nm CMOS technology ', Paper presented at IEEE International Symposium on Quality Electronic Design, San Jose, United States, 16/03/2009-18/03/2009 . < http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=4810287 >

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=pure_au_____::9ea459b06b0145496481eb7baba6319a
https://pure.au.dk/portal/da/publications/new-subthreshold-concepts-in-65nm-cmos-technology(90b98e89-1088-4d37-8210-550bb9b1c224).html