Reacting Oxide Nanoparticles with a Substrate.

Autor: Winterstein, JP, Carter, CB

Publikováno v: Microscopy & Microanalysis; Jul2009 Supplement 2, Vol. 15 Issue S2, p1332-1333, 2p

Metal Nanostructures on Ceramic Surfaces for Energy Applications.

Autor: Basu, J, Bhowmick, S, Winterstein, JP, Ravishankar, N, Carter, CB

Publikováno v: Microscopy & Microanalysis; Jul2009 Supplement 2, Vol. 15 Issue S2, p1442-1443, 2p

In situ oxidation and reduction of cerium dioxide nanoparticles studied by scanning transmission electron microscopy.

Autor: Johnston-Peck AC; Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA. Electronic address: aaron.johnston-peck@nist.gov., Yang WD; Center for Nanoscience and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA; Maryland NanoCenter University of Maryland College Park, MD 20742, USA., Winterstein JP; Center for Nanoscience and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA., Sharma R; Center for Nanoscience and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA., Herzing AA; Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA. Electronic address: andrew.herzing@nist.gov.

Publikováno v: Micron (Oxford, England : 1993) [Micron] 2018 Dec; Vol. 115, pp. 54-63. Date of Electronic Publication: 2018 Aug 30.

Oxidation-state sensitive imaging of cerium dioxide by atomic-resolution low-angle annular dark field scanning transmission electron microscopy.

Autor: Johnston-Peck AC; Materials Measurement Lab, National Institute of Standards Technology, Gaithersburg, MD 20899, USA. Electronic address: aaron.johnston-peck@nist.gov., Winterstein JP; Center for Nanoscale Science and Technology, National Institute of Standards Technology, Gaithersburg, MD 20899, USA., Roberts AD; Department of Chemistry and Center for Nanostructured Electronic Materials, University of Florida, Gainesville, FL 32611, USA., DuChene JS; Department of Chemistry and Center for Nanostructured Electronic Materials, University of Florida, Gainesville, FL 32611, USA., Qian K; Department of Chemistry and Center for Nanostructured Electronic Materials, University of Florida, Gainesville, FL 32611, USA., Sweeny BC; Department of Chemistry and Center for Nanostructured Electronic Materials, University of Florida, Gainesville, FL 32611, USA., Wei WD; Department of Chemistry and Center for Nanostructured Electronic Materials, University of Florida, Gainesville, FL 32611, USA., Sharma R; Center for Nanoscale Science and Technology, National Institute of Standards Technology, Gaithersburg, MD 20899, USA., Stach EA; Center for Functional Nanomaterials, Brookhaven National Laboratory, Upton, NY 11793, USA., Herzing AA; Materials Measurement Lab, National Institute of Standards Technology, Gaithersburg, MD 20899, USA.

Publikováno v: Ultramicroscopy [Ultramicroscopy] 2016 Mar; Vol. 162, pp. 52-60. Date of Electronic Publication: 2015 Dec 17.

Temperature Calibration for In Situ Environmental Transmission Electron Microscopy Experiments.

Autor: Winterstein JP; 1FEI Company,5350 NE Dawson Creek Drive,Hillsboro,Oregon 97124USA., Lin PA; 2NIST,100 Bureau Dr.,Gaithersburg,MD,USA., Sharma R; 2NIST,100 Bureau Dr.,Gaithersburg,MD,USA.

Publikováno v: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada [Microsc Microanal] 2015 Dec; Vol. 21 (6), pp. 1622-1628. Date of Electronic Publication: 2015 Oct 06.