Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Winston S. Shue"'
Autor:
Y.H. Lin, C.C. Lee, C.Y. Liao, M.H. Lin, W. C. Tu, Robin Chen, H.P. Chen, Winston S. Shue, Min Cao
Publikováno v:
2023 IEEE International Reliability Physics Symposium (IRPS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ef8d0ebc84815077adfafab74bac26a6
https://doi.org/10.1109/irps48203.2023.10117795
https://doi.org/10.1109/irps48203.2023.10117795
Autor:
H.P. Chen, Y.H. Wu, H.Y. Huang, C.H. Tsai, S.K. Lee, C.C. Lee, T.H. Wei, H.C. Yao, Y.C. Wang, C.Y. Liao, H.K. Chang, C.W. Lu, Winston S. Shue, Min Cao
Publikováno v:
2021 IEEE International Electron Devices Meeting (IEDM).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::41140a01a34304bcb6f9f1861b6a0e1b
https://doi.org/10.1109/iedm19574.2021.9720600
https://doi.org/10.1109/iedm19574.2021.9720600
Publikováno v:
ECS Meeting Abstracts. :666-666
not Available.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::af965dd15366079c410a8abd14537b31
https://doi.org/10.1149/ma2005-02/17/666
https://doi.org/10.1149/ma2005-02/17/666