Zobrazeno 1 - 10
of 25
pro vyhledávání: '"Wim Dobbelaere"'
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 41:4771-4781
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8511cdd2c8c819b0d9f9514a71b4106c
https://doi.org/10.1109/tcad.2021.3139311
https://doi.org/10.1109/tcad.2021.3139311
Autor:
Jhon Gomez, Nektar Xama, Dirk Lootens, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Georges Gielen
Publikováno v:
IEEE Transactions on Electron Devices. 69:4796-4802
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bfdd5d40abf411a75f46319072e0ada1
https://doi.org/10.1109/ted.2022.3191990
https://doi.org/10.1109/ted.2022.3191990
ispartof: Ieee Transactions On Computer-Aided Design Of Integrated Circuits And Systems status: published
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d6cc4f8538549b0e41b79e07e739db40
https://lirias.kuleuven.be/handle/20.500.12942/718955
https://lirias.kuleuven.be/handle/20.500.12942/718955
Autor:
Nektar Xama, Baris Esen, Wim Dobbelaere, Jhon Gomez, Martin Andraud, Georges Gielen, Ronny Vanhooren, Anthony Coyette
Publikováno v:
ACM Transactions on Design Automation of Electronic Systems. 25:1-27
Safety-critical and mission-critical systems, such as airplanes or (semi-)autonomous cars, are relying on an ever-increasing number of embedded integrated circuits. Consequently, there is a need for complete defect coverage during the testing of thes
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d07ac0ab53ba35ffb70c4521532ceedb
https://doi.org/10.1145/3408063
https://doi.org/10.1145/3408063
Autor:
Stephen Sunter, Nektar Xama, Michal Wolinski, Georges Gielen, Ronny Vanhooren, Anthony Coyette, Wim Dobbelaere, Jhon Gomez
Publikováno v:
ITC
Automotive applications are driving the need for better IC quality, reliability, and functional safety, in a market that is cost-sensitive and rapidly changing. The goals are to deliver zero defective parts without time-consuming and expensive burn-i
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::54b8f74d633335fa4cfa7b09286ce457
https://doi.org/10.1109/itc44778.2020.9325230
https://doi.org/10.1109/itc44778.2020.9325230
Publikováno v:
ETS
In this work, a novel outlier detection method is presented in which the data from the visual inspection of manufactured wafers are combined with the data from the electrical test. Three different implementations are built with increasing complexity
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4235e6fc6aa79f59a894e49901ddcdf0
https://doi.org/10.1109/ets48528.2020.9131593
https://doi.org/10.1109/ets48528.2020.9131593
Autor:
Martin Andraud, Georges Gielen, Ronny Vanhooren, Wim Dobbelaere, Anthony Coyette, Nektar Xama, Jhon Gomez, Jakob Raymaekers
Publikováno v:
STARTPAGE=1;ENDPAGE=6;TITLE=2020 IEEE European Test Symposium (ETS)
ETS
ETS
With tightening automotive IC production test requirements, test escape rates need to decrease down to the 10 PPB level. To achieve this for mixed-signal ICs, advanced multivariate statistical techniques are needed, as the defects in the test escapes
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1a1fa34e6cff36870929b5a571347d9c
https://cris.maastrichtuniversity.nl/en/publications/18fa7855-6e31-4266-b501-6a3dece8e6f2
https://cris.maastrichtuniversity.nl/en/publications/18fa7855-6e31-4266-b501-6a3dece8e6f2
Publikováno v:
VTS
Test detection of lifetime failures due to latent defects is a necessity to reach the tightening quality requirements of automotive systems. This paper presents a pinhole latent defect model, together with a simulation workflow, that can be used to d
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1f0f5b0d315bc013f36eef1778cb6c50
https://doi.org/10.1109/vts48691.2020.9107625
https://doi.org/10.1109/vts48691.2020.9107625
Publikováno v:
IEEE Design & Test. 35:15-23
Analog and mixed-signal circuitry forms a substantial part of automotive electronics, and their test application time contributes predominantly to the overall test time. The authors present a low-cost design-for-test technique that allows a high-leve
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2050d0ffb7c7e14759aa8391cf20335b
https://doi.org/10.1109/mdat.2018.2799803
https://doi.org/10.1109/mdat.2018.2799803
Publikováno v:
IEEE Design & Test. 35:24-30
This paper presents an integrated workflow for design-for-test and test signal generation of mixed-signal circuits. The DfT phase pre-partitions the core under test and allows an efficient automatic generation of test signals. —Hans-Joachim Wunderl
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::28a805621fbeb9af1e2da63fff0ce5ba
https://doi.org/10.1109/mdat.2018.2799800
https://doi.org/10.1109/mdat.2018.2799800