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pro vyhledávání: '"Wilshaw PR"'
Publikováno v:
Solar Energy Materials and Solar Cells. 173
The alneal is one of the most effective methods of electrically passivating a silicon surface, and has been used by numerous research groups since the 1980s. In this work, we present an enhanced alneal process that substantially improves its effectiv
Autor:
Bonilla Osorio, RS, Wilshaw, PR
The recombination of electric charge carriers at semiconductor surfaces continues to be a limiting factor in achieving high performance optoelectronic devices, including solar cells, laser diodes and photodetectors. The theoretical model and a soluti
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https://ora.ox.ac.uk/objects/uuid:0fe4c0fc-678b-47b7-9711-bf3992075cb6
Well-characterized α, β and screw dislocations have been created in GaAs specimens. dislocation segments which thread the semiconductor surface at a known angle have been studied in terms of their behavior as recombination centres and an analysis o
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https://ora.ox.ac.uk/objects/uuid:b204c193-2c74-4800-bba3-85b9053e3962
It is now well known that the field emission performance of single crystal silicon field emitters is improved by the formation of porous silicon on their surface. However, single crystal based displays are likely to be expensive and difficult to scal
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https://ora.ox.ac.uk/objects/uuid:c249d259-f04f-4959-b371-9dd594043243
Electron microscopy techniques have great potential for dopant profiling because of their high spatial resolution in two-dimensions (2-D). Previous work has shown that contrast arises between p-, n- and i-doped material when observed in the secondary
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https://ora.ox.ac.uk/objects/uuid:8892e273-9007-4eb9-aae6-e35705af2373
Results are presented of the EBIC contrast and hence recombination efficiency of a large variety of extended defects. It is shown that the recombination behaviour can be split into three categories associated with strong, medium and weak contrast def
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https://ora.ox.ac.uk/objects/uuid:7a62f78e-625f-4bbb-bdd8-d1e64398e1d8
Field emission characterisation of gridded silicon FEAs was carried out before and after anodisation. Each sample contains ten gridded FEAs with array sizes varying from I to 10x10. For each sample, both current-voltage and current-time measurements
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