Zobrazeno 1 - 10
of 17
pro vyhledávání: '"William T. Estler"'
Autor:
Alessandro Balsamo, Richard Leach, Harald Bosse, William T. Estler, L. De Chiffre, Simone Carmignato
Publikováno v:
CIRP Annals. 69:693-716
Dimensional measurements play a central role in enabling advanced manufacturing technologies, enhancing the quality of products and increasing productivity. This role becomes even more important in the context of Industry 4.0, where reliable and accu
Autor:
Robert Schmitt, Ben Richard Hughes, E. Morse, Frank Härtig, Gert Goch, Wolfgang Knapp, Alistair B. Forbes, Maurizio Galetto, Martin Peterek, William T. Estler
Publikováno v:
CIRP Annals. 65:643-665
The field of Large-Scale Metrology has been studied extensively for many decades and represents the combination and competition of topics as diverse as geodesy and laboratory calibration. A primary reason that Large-Scale Metrology continues to repre
Publikováno v:
CIRP Annals. 51:451-454
Interferometric radius measurements may be completed using a radius bench, where radius is defined as the displacement between the confocal and cat's eye nulls (identified using a figure measuring interferometer). Measurements of a Zerodur sphere hav
Publikováno v:
CIRP Annals. 51:587-609
Developments in large-scale engineering metrology since the 1978 report of Puttock are reviewed. Advances in optical technology and fast, low-cost computation have led to wide-spread use of laser trackers and digital photogrammetry for general-purpos
Autor:
E.G. Thwaite, Don A. Lucca, Hisayoshi Sato, Jacques Peters, Robert J. Hocken, Theodore V. Vorburger, H. Kunzmann, H. Trumpold, T. Pfeifer, J. Peklenik, Paul Vanherck, William T. Estler, Christopher J. Evans, J.B. Bryan, S. Sartori
Publikováno v:
CIRP Annals. 50:471-488
An overview of the contribution of the members of the C.I.R.P. community to the progress of Metrology and Surface Roughness Quality Evaluation is given. The following items are included in the part on metrology: brief overview of the existing situati
Autor:
Y H. Queen, William T. Estler
Publikováno v:
CIRP Annals. 49:415-418
We present a new technique for calibrating the apex angles of dispersion prisms, which are used in the measurement of the index of refraction of optical glasses. The new method requires only a phase measuring interferometer, together with an electron
Publikováno v:
Journal of Research of the National Institute of Standards and Technology
We describe the use of Bayesian inference to include prior information about the value of the measurand in the calculation of measurement uncertainty. Typical examples show this can, in effect, reduce the expanded uncertainty by up to 85 %. The appli
Autor:
William T. Estler
Publikováno v:
Journal of Research of the National Institute of Standards and Technology
We analyze two types of full-circle angle calibrations: a simple closure in which a single set of unknown angular segments is sequentially compared with an unknown reference angle, and a dual closure in which two divided circles are simultaneously ca
Publikováno v:
Precision Engineering. 22:87-97
This paper examines the measurement uncertainty of small circular features as a function of the sampling strategy; i.e., the number and distribution of measurement points. Specifically, we examine measuring a circular feature using a three-point samp
Publikováno v:
CIRP Annals - Manufacturing Technology. 42:573-576
We describe the new Advanced Automated Master Angle Calibration System (AAMACS) at the U. S. National Institute of Standards and Technology. The heart of this system is a set of three stacked concentric indexing tables with 832, 729, and 625 teeth re