Zobrazeno 1 - 10
of 17
pro vyhledávání: '"William J. Ooms"'
Autor:
J. Kulik, Peter Fejes, Yi Wei, Alexander A. Demkov, William J. Ooms, X. Hu, H. Li, John L. Edwards, Xiaodong Zhang, Ravindranath Droopad, Zhiyi Jimmy Yu, K. Moore
Publikováno v:
Journal of Applied Physics. 93:4521-4525
Most semiconductor materials such as Si, Ge, and GaAs are subject to oxidation when exposed to oxidants. This results in difficulties in the heterointegration of epitaxial oxides on these semiconductors. Even though certain oxides may be thermodynami
Autor:
Corey Overgaard, Zhiyi Jimmy Yu, William J. Ooms, Ravi Droopad, Jay Curless, K. Eisenbeiser, Jamal Ramdani, Jeffrey M. Finder, Lyndee L. Hilt, John L. Edwards
Publikováno v:
Materials Science and Engineering: B. 87:292-296
Thin films of perovskite-type oxide SrTiO 3 have been grown epitaxially on Si(001) substrates using molecular beam epitaxy. Using reflection high energy electron diffraction (RHEED) we have determined the optimum growth conditions for these type of o
Autor:
Xiaoming Hu, William J. Ooms, John L. Edwards, Jay Curless, Ravindranath Droopad, K. Eisenbeiser, Dror Sarid, Zhiyi Jimmy Yu
Publikováno v:
Applied Surface Science. 181:103-110
The adsorption of submonolayers and monolayers of strontium and barium on Si(1 0 0) are reported using low energy electron diffraction (LEED) and Auger electron spectroscopy (AES). The samples were prepared by deposition at room temperature followed
Autor:
Charles A. Peterson, Jamal Ramdani, Xiaoming Hu, Jay Curless, William J. Ooms, Ravi Droopad, Zhiyi Jimmy Yu, Xiaowei Yao, Junling Wang, Daniel S. Marshall, Dror Sarid, J. A. Hallmark
Publikováno v:
Surface Science. 457:L391-L396
The initial stages of barium adsorption on Si(100)-(2×1) at room temperature has been studied by ultrahigh vacuum scanning tunneling microscopy (STM) under both positive and negative sample-bias imaging conditions. Two distinct adsorption sites have
Autor:
Jamal Ramdani, Vidya Kaushik, Jay Curless, William J. Ooms, Jeffrey M. Finder, Corey Overgaard, S Pietambaram, Zhiyi Jimmy Yu, J. A. Hallmark, K. Eisenbeiser, Ravindranath Droopad, Prasad V. Alluri
Publikováno v:
Applied Surface Science. :127-133
Single-crystal SrTiO3 has been grown on Si(100) using molecular beam epitaxy (MBE). The growth conditions, especially at the initial stage of nucleation, have a great impact on the SrTiO3/Si interface. A regrowth of an amorphous interfacial layer as
Autor:
Charles A. Peterson, William J. Ooms, Ravi Droopad, J. A. Hallmark, Xiaoming Hu, Daniel S. Marshall, Junling Wang, Dror Sarid, Xiaowei Yao, Zhiyi Jimmy Yu
Publikováno v:
Surface Science. 445:256-266
The initial stages and surface structures of the (3×2) phase of Ba adsorption on an Si(100)-2×1 surface held at 900°C have been studied by low-energy electron diffraction, Auger electron spectroscopy, and ultra-high vacuum scanning tunneling micro
Autor:
J. A. Hallmark, Pablo Ordejón, Emilio Artacho, Javier Junquera, William J. Ooms, Daniel S. Marshall, Jun Wang, Daniel Sánchez-Portal, José M. Soler
Publikováno v:
Scopus-Elsevier
Bonding and diffusion of a Ba adatom on a Si(001) surface have been studied using first-principles density-functional calculations. It is found that the favorable bonding site of the adatom is the fourfold site located in the trough between Si dimer
Autor:
J. A. Hallmark, Xiaoming Hu, Charles A. Peterson, Dror Sarid, Daniel S. Marshall, William J. Ooms, Ravi Droopad, Junling Wang, Zhiyi Jimmy Yu
Publikováno v:
Surface Science. 426:69-74
Phase transitions of Ba adsorption on a clean Si(001)-(2×1) studied by low energy electron diffraction (LEED) and Auger electron spectroscopy (AES) are reported. The depositions of the Ba were performed with (a) the substrate held at room temperatur
Autor:
Jeffrey M. Finder, S. Rockwell, K. Eisenbeiser, Rudy Emrick, Corey Overgaard, Zhiyi Jimmy Yu, John Holmes, Ravindranath Droopad, William J. Ooms
Publikováno v:
IEEE Electron Device Letters. 23:300-302
Heteroepitaxial growth of GaAs on an Si substrate has been achieved through the use of crystalline SrTiO/sub 3/ (STO) and amorphous SiO/sub 2/ buffer layers. The buffer layers serve to accommodate some of the lattice mismatch between the substrate an
Publikováno v:
IEEE Transactions on Electron Devices. 40:278-284
A new self-aligned p-channel HFET structure was evaluated for application to complementary HFET circuits. The AlGaAs/InGaAs HFET structure uses an anisotype graded n/sup +/ InGaAs/GaAs semiconductor gate to enhance the barrier height of the FET, resu