Zobrazeno 1 - 10
of 16
pro vyhledávání: '"William J Headrick"'
Autor:
Matt J Smith, William J Headrick
Publikováno v:
2022 IEEE AUTOTESTCON.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8605b8dfe2c78ddace7101ebfd3ddab8
https://doi.org/10.1109/autotestcon47462.2022.9984785
https://doi.org/10.1109/autotestcon47462.2022.9984785
Autor:
William J Headrick
Publikováno v:
2022 IEEE AUTOTESTCON.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::09c62a03e9433e366c16dab6380670d3
https://doi.org/10.1109/autotestcon47462.2022.9984804
https://doi.org/10.1109/autotestcon47462.2022.9984804
Publikováno v:
2022 IEEE AUTOTESTCON.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6f4ab5af1315e22dd91967f28fcad58d
https://doi.org/10.1109/autotestcon47462.2022.9984772
https://doi.org/10.1109/autotestcon47462.2022.9984772
Autor:
Gilberto Garcia, William J Headrick
Publikováno v:
IEEE Instrumentation & Measurement Magazine. 21:22-26
For modern Automatic Test Equipment (ATE) one of the common tasks is the process of re-imaging and re-configuration of the test station. This can occur due to hardware faults, disk corruption, or planned software updates. With the requirement of mode
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d5753745e815d567468cbdd188198332
https://doi.org/10.1109/mim.2018.8423742
https://doi.org/10.1109/mim.2018.8423742
Publikováno v:
2019 IEEE AUTOTESTCON.
Relative to widely utilized data analytic techniques, adaptive predictive modeling of supply chain material through automated data testing and trending techniques provide an alternate approach that is less costly, more time efficient, and of greater
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8fe4e04aa6a0125fdf4f2348bc4f5afc
https://doi.org/10.1109/autotestcon43700.2019.8961039
https://doi.org/10.1109/autotestcon43700.2019.8961039
Autor:
William J Headrick, Gokul Subramanian
Publikováno v:
2019 IEEE AUTOTESTCON.
For modern Automatic Test Equipment (ATE) one of the most daunting tasks is now Information Assurance (IA). What was once at most a secondary item consisting mainly of installing an Anti-Virus suite is now becoming one of the most important aspects o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7bb535482341ebbe6062c791c3c2c4c3
https://doi.org/10.1109/autotestcon43700.2019.8961073
https://doi.org/10.1109/autotestcon43700.2019.8961073
Publikováno v:
2018 IEEE AUTOTESTCON.
For modern Automatic Test Equipment (ATE) one of the most daunting tasks is now Information Assurance (IA). What was once at most a secondary item consisting mainly of installing an Anti-Virus suite is now becoming one of the most important aspects o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::61540e3b77f7d05bec33ec9c2cc6c5f3
https://doi.org/10.1109/autest.2018.8532516
https://doi.org/10.1109/autest.2018.8532516
Autor:
William J Headrick, Christopher Geiger
Publikováno v:
2017 IEEE AUTOTESTCON.
Automated Test Systems (ATSs) can join the Internet of Things (IoT) at multiple layers and benefit both the overall IoT concept as well as advance the goals of ATSs. Logistics and sustainment are traditionally brought into the IoT conversation throug
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ef01867e552363bf8cff89a0bbbfeb00
https://doi.org/10.1109/autest.2017.8080487
https://doi.org/10.1109/autest.2017.8080487
Autor:
Scott Jennings, William J Headrick
Publikováno v:
2016 IEEE AUTOTESTCON.
For modern Automatic Test Equipment, it is not unusual to have multiple computers making up a single system. One issue with having multiple computers is the requirement for each computer to have a disk drive and associated operating system. This beco
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ea0080dba281cfa965d484a44fd80864
https://doi.org/10.1109/autest.2016.7589576
https://doi.org/10.1109/autest.2016.7589576
Autor:
William J Headrick
Publikováno v:
2015 IEEE AUTOTESTCON.
In modern systems there is a desire to create Test Program Sets (TPSs) in multiple languages. However, most Automatic Test Equipment (ATE) is designed with only one test executive in mind and the exclusion of all others. This paper discusses a proven
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9acb95ab9a3198f3908bb7f334e57e16
https://doi.org/10.1109/autest.2015.7356472
https://doi.org/10.1109/autest.2015.7356472