Zobrazeno 1 - 10
of 69
pro vyhledávání: '"William G, Cullen"'
Publikováno v:
Beilstein Journal of Nanotechnology, Vol 3, Iss 1, Pp 230-237 (2012)
Key developments in NC-AFM have generally involved atomically flat crystalline surfaces. However, many surfaces of technological interest are not atomically flat. We discuss the experimental difficulties in obtaining high-resolution images of rough s
Externí odkaz:
https://doaj.org/article/ad4dc14839f441588667a14a35ba7aff
Autor:
Franz J. Giessibl, Daniel Walkup, Marlou R. Slot, Son T. Le, Steven R. Blankenship, Joseph A. Stroscio, Young Kuk, Sungmin Kim, Julian Berwanger, Johannes Schwenk, William G. Cullen, Hans J. Hug, Sasa Vranjkovic, Fereshte Ghahari
Publikováno v:
Rev Sci Instrum
Research in new quantum materials requires multi-mode measurements spanning length scales, correlations of atomic-scale variables with macroscopic function, and spectroscopic energy resolution obtainable only at millikelvin temperatures, typically in
'The Princess and the Pea' at the Nanoscale: Wrinkling and Delamination of Graphene on Nanoparticles
Autor:
Mahito Yamamoto, Olivier Pierre-Louis, Jia Huang, Michael S. Fuhrer, Theodore L. Einstein, William G. Cullen
Publikováno v:
Physical Review X, Vol 2, Iss 4, p 041018 (2012)
Thin membranes exhibit complex responses to external forces or geometrical constraints. A familiar example is the wrinkling, exhibited by human skin, plant leaves, and fabrics, that results from the relative ease of bending versus stretching. Here, w
Externí odkaz:
https://doaj.org/article/c2ac9ac76c804185a3e0d83b85f400ff
Publikováno v:
Small. 11:4946-4958
A carbon-nanotube-enabling scanning probe technique/nanotechnology for manipulating and measuring lithium at the nano/mesoscale is introduced. Scanning Li-nanopipette and probe microscopy (SLi-NPM) is based on a conductive atomic force microscope (AF
Autor:
Duming, Zhang, Jeonghoon, Ha, Hongwoo, Baek, Yang-Hao, Chan, Fabian D, Natterer, Alline F, Myers, Joshua D, Schumacher, William G, Cullen, Albert V, Davydov, Young, Kuk, M Y, Chou, Nikolai B, Zhitenev, Joseph A, Stroscio
Publikováno v:
Physical review materials. 1(2)
We report a rectangular charge density wave (CDW) phase in strained 1T-VSe2 thin films synthesized by molecular beam epitaxy on c-sapphire substrates. The observed CDW structure exhibits an unconventional rectangular 4a×√3a periodicity, as opposed
Autor:
William G. Cullen, Jeonghoon Ha, Young Kuk, Hongwoo Baek, Duming Zhang, Fabian D. Natterer, Yang-Hao Chan, Mei-Yin Chou, Alline F. Myers, Joseph A. Stroscio, Nikolai B. Zhitenev, Albert V. Davydov, Joshua Schumacher
Publikováno v:
Physical Review Materials. 1
We report a rectangular charge density wave (CDW) phase in strained 1T-VSe2 thin films synthesized by molecular beam epitaxy on c-sapphire substrates. The observed CDW structure exhibits an unconventional rectangular 4a×√3a periodicity, as opposed
Autor:
Takashi Taniguchi, Fereshte Ghahari, Joseph A. Stroscio, Leonid Levitov, Nikolai B. Zhitenev, Joaquin F. Rodriguez-Nieva, Fabian D. Natterer, Daniel Walkup, Jonathan Wyrick, Yue Zhao, Kenji Watanabe, William G. Cullen, Christopher Gutierrez
Publikováno v:
arXiv
Flicking the Berry phase switch When an electron completes a cycle around the Dirac point (a particular location in graphene's electronic structure), the phase of its wave function changes by π. This so-called Berry phase is tricky to observe direct
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6bdc738278d700e25e186d8630a6ca40
Publikováno v:
The Journal of Physical Chemistry C. 117:25643-25649
Exposure to oxygen at 300–340 °C results in triangular etch pits with uniform orientation on the surfaces of atomically thin molybdenum disulfide (MoS2), indicating anisotropic etching terminating on lattice planes. The triangular pits grow latera
Autor:
William G. Cullen, Kenji Watanabe, Michael S. Fuhrer, Takashi Taniguchi, Kristen M. Burson, Cory Dean, Philip Kim, Shaffique Adam
Publikováno v:
Nano Letters. 13:3576-3580
Kelvin probe microscopy in ultrahigh vacuum is used to image the local electrostatic potential fluctuations above hexagonal boron nitride (h-BN) and SiO2, common substrates for graphene. Results are compared to a model of randomly distributed charges
Autor:
Takashi Taniguchi, Yue Zhao, William G. Cullen, Joseph A. Stroscio, Fabian D. Natterer, Jonathan Wyrick, Kenji Watanabe, Nikolai B. Zhitenev
Publikováno v:
ACS nano. 10(12)
Our ability to access and explore the quantum world has been greatly advanced by the power of atomic manipulation and local spectroscopy with scanning tunneling and atomic force microscopes, where the key technique is the use of atomically sharp prob