Výsledky vyhledávání - "William Courbat"

Strategies to Identify Physical Origin of Contrast in EBIRCH

Autor: Grigore Moldovan, William Courbat

Publikováno v: International Symposium for Testing and Failure Analysis.

The Electron Beam Induced Resistance Change (EBIRCH) technique is becoming more popular for localization of defects in Electrical Failure Analysis (EFA). Whilst EBIRCH is clear and straightforward in the procedure that must be followed for localizati

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::a3a5153c9365fb0da8408f8a99e8d5db
https://doi.org/10.31399/asm.cp.istfa2022p0277

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Faster and More Accurate Failure Analysis: Circuit Editing and Short Localization Performed at Same Tilt Angle using Multiple Techniques

Autor: William Courbat, Jörg Jatzkowski

Publikováno v: EDFA Technical Articles. 21:22-28

A recent trend in semiconductor failure analysis involves combining the use of different tools and techniques in order to acquire more accurate data at a faster rate. This article describes a new workflow that combines FIB, GIS, and nanoprobing, all

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::6d7edd0e05726b6670c713d39943352b
https://doi.org/10.31399/asm.edfa.2019-4.p022

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