Zobrazeno 1 - 10
of 24
pro vyhledávání: '"William B. Ray"'
Autor:
William B. Ray, Joshua Yu, Christopher Thomas, David I. Bigio, Johnny Russo, Stephen B. Bayne, Marc Litz, Hansol Cho, Tariq Rizvi Alam, Gerald M. Rosen
Publikováno v:
Applied Radiation and Isotopes. 144:93-103
Unattended, compact, terrestrial and space sensors require sources that have high energy and power densities to continuously operate for 3 to 99 years depending on application. Currently, chemical sources cannot fully satisfy these applications, espe
Publikováno v:
Applied Radiation and Isotopes. 130:66-74
Energy dense power sources are critical to the development of compact, remote sensors for terrestrial and space applications. Nuclear batteries using β--emitting radioisotopes possess energy densities 1000 times greater than chemical batteries. Thei
Publikováno v:
Applied Radiation and Isotopes. 125:66-73
Beta radioisotope energy sources, such as tritium (3H), have shown significant potential in satisfying the needs of a sensor-driven world. The limitations of current beta sources include: (i) low beta-flux power, (ii) intrinsic isotope leakage and (i
Publikováno v:
Applied Energy. 191:10-21
Low illumination (10 −4 suns) and indoor light energy harvesting is needed to meet the demands of zero net energy (ZNE) building, Internet of Things (IoT), and beta-photovoltaic energy harvesting systems to power remote sensors. Photovoltaic (PV) s
Autor:
Bejoy N. Pushpakaran, William B. Ray, Stephen B. Bayne, Emily A. Hirsch, James A. Schrock, Mitchell D. Kelley, Argenis Bilbao, S. Holt
Publikováno v:
IEEE Transactions on Power Electronics. 31:1816-1821
SiC MOSFETs are a leading option for increasing the power density of power electronics; however, for these devices to supersede the Si insulated-gate bipolar transistor, their characteristics have to be further understood. Two SiC vertically oriented
Autor:
William B. Ray, Heather O'Brien, Aderinto Ogunniyi, Stephen B. Bayne, Jose A. Rodriguez, Matthew Kim
Publikováno v:
2018 IEEE International Power Modulator and High Voltage Conference (IPMHVC).
Gallium nitride (GaN) high electron mobility transistors (HEMTs) are an ideal option in applications of power electronics due to the wide-bandgap properties of the material. High electron mobility is gained through the device’s unique channel struc
Autor:
Argenis Bilbao, Kevin Lawson, William B. Ray, James A. Schrock, S. Holt, Stephen B. Bayne, John W. Palmour, Lin Cheng, Charles Scozzie
Publikováno v:
IEEE Transactions on Power Electronics. 30:2891-2895
For SiC DMOSFETs to obtain widespread usage in power electronics their long-term operational ability to handle the stressful transient current and high temperatures common in power electronics needs to be further verified. To determine the long-term
Autor:
Stephen B. Bayne, James A. Schrock, Argenis Bilbao, William B. Ray, K. R. Popp, Matthew Kim, C. Tchoupe-Nono
Publikováno v:
2016 IEEE 4th Workshop on Wide Bandgap Power Devices and Applications (WiPDA).
Gallium Nitride (GaN) High Electron Mobility Transistors (HEMTs) are a new technology that is of great interest in pulsed power and power electronics application due to the demonstrated capabilities of Silicon Carbide (SiC) transistors. As there are
Autor:
Stephen B. Bayne, William B. Ray, Aderinto Ogunniyi, Heather O'Brien, Argenis Bilbao, Emily A. Hirsch, James A. Schrock, Shelby Lacouture, Michael Giesselmann
Publikováno v:
2016 IEEE International Power Modulator and High Voltage Conference (IPMHVC).
Silicon carbide Super Gate Turn-Off (SGTO) thyristors are an advanced technology for increasing the power density of high voltage pulsed power or power electronic systems. However, the transient characteristics and failure modes of these devices have
Low and indoor light energy harvesting is needed to meet the demands of zero net energy (ZNE) building, Internet of Things (IoT), and indirect energy conversion isotope battery (IDEC iBAT) systems. Characterizing photovoltaic (PV) solar cells under l
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fa0790a02eb947a3758dd044cbc8ffbb
https://doi.org/10.21236/ada625514
https://doi.org/10.21236/ada625514