Zobrazeno 1 - 10
of 15
pro vyhledávání: '"William Jarrett"'
Publikováno v:
Frontiers in Marine Science, Vol 1 (2014)
Externí odkaz:
https://doaj.org/article/a81fdf93da494c5f9bd9e75576c964cb
Publikováno v:
International Journal of Surgical Oncology, Vol 2011 (2011)
The role of lymph node dissection remains controversial in the surgical management of renal cell carcinoma. Incidental renal masses are being diagnosed at increasing rates due to the routine use of CT scans. Despite the increase in incidental diagnos
Externí odkaz:
https://doaj.org/article/8c574049dab048fda780f68d5bf7e905
Publikováno v:
Process, Equipment, and Materials Control in Integrated Circuit Manufacturing V.
This paper discusses the integration and development of advanced process control technologies with AMD's Fab25 factory systems using the Advance Process Control Framework. The Framework is an open software architecture that allows the integration of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::07a73e3e31397ae8960b3d4ef9b5c0cb
https://doi.org/10.1117/12.361323
https://doi.org/10.1117/12.361323
Autor:
Campbell, William Jarrett
Publikováno v:
Digital version accessible at.
Thesis (Ph. D.)--University of Texas at Austin, 1999.
Vita. Includes bibliographical references (leaves 133-142). Available also in a digital version from Dissertation Abstracts.
Vita. Includes bibliographical references (leaves 133-142). Available also in a digital version from Dissertation Abstracts.
Externí odkaz:
http://wwwlib.umi.com/cr/utexas/main
Publikováno v:
Process, Equipment, and Materials Control in Integrated Circuit Manufacturing IV.
With the introduction of high-throughput, multi-arm chemical-mechanical planarization (CMP) tools, a new source of process variation is introduced to the CMP process. These arm-to-arm variations are caused by small differences in the polishing rates
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4d38881ca19c67520e7ca4c9231d7c78
https://doi.org/10.1117/12.324360
https://doi.org/10.1117/12.324360
Publikováno v:
SPIE Proceedings.
Many steps in the manufacturing of semiconductors offer no opportunity for real-time measurement of the wafer state, necessitating the use of pre- and post-process measurements of the wafer state in a run-to-run control algorithm. The predominant alg
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b6c3ff0d94eb11f7d36dcbd3219cd806
https://doi.org/10.1117/12.284636
https://doi.org/10.1117/12.284636
Autor:
Theodore Novitsky, Christopher Lange, William Jarrett, Lon Mathias, Scott Osborn, Roger Ayotte, Steve Manning
Publikováno v:
Journal of Applied Polymer Science; Jun2010, Vol. 116 Issue 6, p3388-3395, 8p
Publikováno v:
Journal of Polymer Science Part B: Polymer Physics; Aug2007, Vol. 45 Issue 16, p2177-2186, 10p
Autor:
Navzer Sachinvala, D. V. Parikh, Paul Sawhney, SeChin Chang, Jerzey Mirzawa, William Jarrett, Beth Joiner
Publikováno v:
Polymers for Advanced Technologies; Aug2007, Vol. 18 Issue 8, p620-628, 9p
Autor:
SeChin Chang, Navzer (Nozar) D. Sachinvala, Paul Sawhney, D. V. Parikh, William Jarrett, Casey Grimm
Publikováno v:
Polymers for Advanced Technologies; Aug2007, Vol. 18 Issue 8, p611-619, 9p