Zobrazeno 1 - 10
of 59
pro vyhledávání: '"Willem van Driel"'
Publikováno v:
Materials, Vol 11, Iss 8, p 1305 (2018)
Degradation mechanisms of silicone plates under harsh environment conditions are studied in this investigation. Environmental degradation of silicone free form, used as secondary optics in Light Emitting Diode LED lighting lamps and luminaires or any
Externí odkaz:
https://doaj.org/article/8e19a972adf34f0d981b32ef3690817d
Publikováno v:
2023 24th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::debf0db751ed5db1593553bfee97f69a
https://doi.org/10.1109/eurosime56861.2023.10100756
https://doi.org/10.1109/eurosime56861.2023.10100756
Publikováno v:
2023 24th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::169178a7df3426a81f60ba6914a2828b
https://doi.org/10.1109/eurosime56861.2023.10100833
https://doi.org/10.1109/eurosime56861.2023.10100833
Autor:
Willem Van Driel
This book aims to provide a comprehensive reference into the critical subject of failure and degradation in organic materials, used in optoelectronics and microelectronics systems and devices. Readers in different industrial sectors, including microe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2d9ca2f46ec44339f91e5881be7fab37
https://doi.org/10.1007/978-3-030-81576-9
https://doi.org/10.1007/978-3-030-81576-9
Publikováno v:
IEEE Access, 10
IEEE Access
IEEE Access
The unique radiative, photometric and colorimetric characteristic of a light-emitting diode is derived from its spectral power distribution. Modeling such characteristics with respect to the forward current, temperature or operating time has been sub
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e1069a162eb9c97615b23ae4e4b0b5b5
https://doi.org/10.1109/access.2022.3197280
https://doi.org/10.1109/access.2022.3197280
Publikováno v:
Proceedngs of the IECON 2022-48th Annual Conference of the IEEE Industrial Electronics Society
IECON 2022 – 48th Annual Conference of the IEEE Industrial Electronics Society
IECON 2022 – 48th Annual Conference of the IEEE Industrial Electronics Society
The objective of this article is to investigate the thermal-fatigue properties of a commercially available lead-free solder alloy (SnBiAgCu) under the use of different types of potting compounds. Solder alloys with lower silver content are expected t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d3306a3df38fa1b3cefce68a7cf562f1
http://resolver.tudelft.nl/uuid:c2eea506-3d5d-462d-ba94-267791f1ac10
http://resolver.tudelft.nl/uuid:c2eea506-3d5d-462d-ba94-267791f1ac10
Autor:
Guoqi Zhang, Willem van Driel, Brahim El Mansouri, R. H. Poelma, L.M. Middelburg, Henk van Zeijl, Johan G. Vogel, Hui Jiang, Jia Wei
Publikováno v:
Microsystems & Nanoengineering, Vol 5, Iss 1, Pp 1-14 (2019)
Microsystems & Nanoengineering, 5(1)
Microsystems & Nanoengineering, 5(1)
Commercially available gravimeters and seismometers can be used for measuring Earth’s acceleration at resolution levels in the order of $${\mathrm{ng}}/\sqrt {\mathrm{Hz}}$$ ng ∕ Hz (where g represents earth’s gravity) but they are typically hi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9fdb201119d1a77a58899796bfe0c735
http://link.springer.com/article/10.1038/s41378-019-0105-y
http://link.springer.com/article/10.1038/s41378-019-0105-y
Publikováno v:
2021 22nd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)
2021 22nd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2021
Microelectronics Reliability, 129
2021 22nd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2021
Microelectronics Reliability, 129
Reliability is an essential scientific and technological domain intrinsically linked with system integration. Nowadays, semiconductor industries are confronted with ever-increasing design complexity, dramatically decreasing design margins, increasing
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::25e6a02fde198957fff46ae72fa13005
https://doi.org/10.1109/eurosime52062.2021.9410861
https://doi.org/10.1109/eurosime52062.2021.9410861
Publikováno v:
2021 22nd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2021
This study intends to set up computational fluid dynamic simulations along with static and dynamic stress simulations to determine maximum possible accelerations and stress levels that may occur for poles having a single luminaire under certain typic
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::823fcd1f80cfe60f6170e70ed592b311
http://resolver.tudelft.nl/uuid:9023c4fd-7dee-4cae-a3fb-b59b2f263b36
http://resolver.tudelft.nl/uuid:9023c4fd-7dee-4cae-a3fb-b59b2f263b36
Publikováno v:
Nanomaterials
Nanomaterials, 10(1)
'Nanomaterials ', vol: 10, pages: 153-1-153-18 (2020)
Volume 10
Issue 1
Nanomaterials, Vol 10, Iss 1, p 153 (2020)
Nanomaterials, 10(1)
'Nanomaterials ', vol: 10, pages: 153-1-153-18 (2020)
Volume 10
Issue 1
Nanomaterials, Vol 10, Iss 1, p 153 (2020)
This paper aims to investigate the synthesis, structure, and optical properties of SiO2@YAG:Ce core&ndash
shell optical nanoparticles for solid state lighting applications. YAG:Ce phosphor is a key part in white light emitting diodes (LEDs), wit
shell optical nanoparticles for solid state lighting applications. YAG:Ce phosphor is a key part in white light emitting diodes (LEDs), wit
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2b26da6713999db35c6a8fb6cdee84b5
https://doi.org/10.3390/nano10010153
https://doi.org/10.3390/nano10010153