Zobrazeno 1 - 1
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pro vyhledávání: '"Wieger Scheepers"'
Autor:
Wieger Scheepers, Marco Van Dam, Denis A.M. Faas, Frank Nowak, Armin Liebchen, Robert John Socha, Eric Hendrickx, Andre Engelen
Publikováno v:
SPIE Proceedings.
Step&Scan systems are pushed towards low k1 applications. Contrast enhancement techniques are crucial for successful implementation of these applications in a production environment. A NA - sigma - illumination mode optimizer and a contrast-based opt
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0d996633196b76a2f30d44cb500a4b49
https://doi.org/10.1117/12.544240
https://doi.org/10.1117/12.544240
