Zobrazeno 1 - 10
of 45
pro vyhledávání: '"Widiez, Julie"'
Autor:
Pilon, Francesco Armand, Niquet, Yann-Michel, Chretien, Jeremie, Pauc, Nicolas, Reboud, Vincent, Calvo, Vincent, Widiez, Julie, Hartmann, Jean Michel, Chelnokov, Alexei, Faist, Jerome, Sigg, Hans
Publikováno v:
Physical Review Research 4, 033050 (2022)
Efficient and cost-effective Si-compatible lasers are a long standing wish of the optoelectronic industry. In principle, there are two options. For many applications, lasers based on III-V compounds provide compelling solutions, even if the integrati
Externí odkaz:
http://arxiv.org/abs/2201.11856
Autor:
Gassenq, Alban, Guilloy, Kevin, Pauc, Nicolas, Rouchon, Denis, Widiez, Julie, Rothman, Johan, Hartmann, Jean-Michel, Chelnokov, Alexei, Reboud, Vincent, Calvo, Vincent
Adding sufficient tensile strain to Ge can turn the material to a direct bandgap group IV semiconductor emitting in the mid-infrared wavelength range. However, highly strained-Ge cannot be directly grown on Si due to its large lattice mismatch. In th
Externí odkaz:
http://arxiv.org/abs/1705.06832
Autor:
Rortais, Fabien, Zucchetti, Carlo, Ghirardini, Lavinia, Ferrari, Alberto, Vergnaud, Céline, Widiez, Julie, Marty, Alain, Attané, Jean-Philippe, Jaffrès, Henri, George, Jean-Marie, Celebrano, Michele, Isella, Giovanni, Ciccacci, Franco, Finazzi, Marco, Bottegoni, Federico, Jamet, Matthieu
Non-local carrier injection/detection schemes lie at the very foundation of information manipulation in integrated systems. This paradigm consists in controlling with an external signal the channel where charge carriers flow between a "source" and a
Externí odkaz:
http://arxiv.org/abs/1612.09136
Autor:
Tardif, Samuel, Gassenq, Alban, Guilloy, Kevin, Pauc, Nicolas, Dias, Guilherme Osvaldo, Hartmann, Jean-Michel, Widiez, Julie, Zabel, Thomas, Marin, Esteban, Sigg, Hans, Faist, Jérôme, Chelnokov, Alexei, Reboud, Vincent, Calvo, Vincent, Micha, Jean-Sébastien, Robach, Odile, Rieutord, François
Micro-Laue diffraction and simultaneous rainbow-filtered micro-diffraction were used to measure accurately the full strain tensor and the lattice orientation distribution at the sub-micron scale in highly strained, suspended Ge micro-devices. A numer
Externí odkaz:
http://arxiv.org/abs/1603.06370
Autor:
Prudkovskiy, Vladimir S., Templier, Roselyne, Moulin, Alexandre, Troutot, Nicolas, Gelineau, Guillaume, Huet, Stéphanie, Le, Van-Hoan, Mony, Karine, Lapertot, Gérard, Delcroix, Mathieu, Caridroit, Simon, Barbet, Sophie, Widiez, Julie
Publikováno v:
Diffusion and Defect Data Part B: Solid State Phenomena; August 2024, Vol. 362 Issue: 1 p71-75, 5p
Autor:
Gelineau, Guillaume, Masante, Cédric, Rolland, Emmanuel, Barbet, Sophie, Corbin, Lucie, Papon, Anne-Marie, Caridroit, Simon, Delcroix, Mathieu, Huet, Stéphanie, Moulin, Alexandre, Prudkovskiy, Vladimir S., Troutot, Nicolas, Rouchier, Séverin, Turchetti, Loic, Mony, Karine, Widiez, Julie
Publikováno v:
Materials Science Forum; August 2024, Vol. 1124 Issue: 1 p57-65, 9p
Autor:
Biard, Hugo, Drouin, Alexis, Schwarzenbach, Walter, Alassaad, Kassem, Coeurdray, Laetitia, Chagneux, Valentine, Coche, Mael, Ledrappier, Sebastien, Monnoye, Sylvain, Mank, Hugues, Rouchier, Séverin, Barge, Thierry, Radisson, Damien, Moulin, Alexandre, Barbet, Sophie, Widiez, Julie, Odoul, Sidoine, Maleville, Christophe
Publikováno v:
Materials Science Forum; August 2024, Vol. 1124 Issue: 1 p21-25, 5p
Autor:
Huet, Stéphanie, Guerber, Sylvain, Rolland, Emmanuel, Szelag, Bertrand, Gelineau, Guillaume, Moulin, Alexandre, Prudkovskiy, Vladimir S., Troutot, Nicolas, Licitra, Christophe, Gergaud, Patrice, Barbet, Sophie, Delcroix, Mathieu, Caridroit, Simon, Amalbert, Vincent, Alonso-Ramos, Carlos, Melati, Daniele, Edmond, Samson, Vivien, Laurent, Mony, Karine, Lapertot, Gérard, Widiez, Julie
Publikováno v:
Materials Science Forum; August 2024, Vol. 1124 Issue: 1 p67-76, 10p
Autor:
Cela, Enrica, Shahidi, Sam, Parangi, Prasant, Shrestha, Ramesh, Simpson, Gavin, Widiez, Julie, Daval, Nicolas, Chapelle, Audrey, Rouchier, Séverin, Schwarzenbach, Walter
Publikováno v:
Diffusion and Defect Data Part A: Defect and Diffusion Forum; May 2023, Vol. 425 Issue: 1 p57-61, 5p
Autor:
Gelineau, Guillaume, Widiez, Julie, Rolland, Emmanuel, Vladimirova, Krenema, Moulin, Alexandre, Prudkovskiy, Vladimir, Troutot, Nicolas, Gergaud, Patrice, Mariolle, Denis, Barbet, Sophie, Amalbert, Vincent, Lapertot, Gérard, Mony, Karine, Rouchier, Séverin, Boulet, Romain, Berre, Guillaume, Schwarzenbach, Walter, Bogumilowicz, Yann
Publikováno v:
Materials Science Forum; May 2023, Vol. 1089 Issue: 1 p71-79, 9p