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Publikováno v:
Conference Record of the Twenty Third IEEE Photovoltaic Specialists Conference - 1993 (Cat. No.93CH3283-9).
In this paper, the authors investigate the use of lifetime measurements as a tool to monitor high-efficiency silicon solar cell processes. Contactless lifetime measurements are carried out after every processing step for monocrystalline float zone wa
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::876b0890e43da8fa2e929fe371b23dbf
https://doi.org/10.1109/pvsc.1993.347161
https://doi.org/10.1109/pvsc.1993.347161
