Zobrazeno 1 - 10
of 25
pro vyhledávání: '"Wernecke, Jan"'
Autor:
Soltwisch, Victor, Haase, Anton, Wernecke, Jan, Probst, Juergen, Schoengen, Max, Burger, Sven, Krumrey, Michael, Scholze, Frank
Publikováno v:
Phys. Rev. B 94, 035419 (2016)
Laterally periodic nanostructures were investigated with grazing incidence small angle X-ray scattering. To support an improved reconstruction of nanostructured surface geometries, we investigated the origin of the contributions to the diffuse scatte
Externí odkaz:
http://arxiv.org/abs/1509.02003
The feature sizes of only a few nanometers in modern nanotechnology and next-generation microelectronics continually increase the demand for suitable nanometrology tools. Grazing incidence small-angle X-ray scattering (GISAXS) is a versatile techniqu
Externí odkaz:
http://arxiv.org/abs/1407.8305
Publikováno v:
J. Synchrotron Rad. (2014). 21, 529-536
A dedicated in-vacuum X-ray detector based on the hybrid pixel PILATUS 1M detector has been installed at the four-crystal monochromator beamline of PTB at the electron storage ring BESSY II in Berlin. Due to its windowless operation, the detector can
Externí odkaz:
http://arxiv.org/abs/1311.5082
Autor:
Wernecke, Jan1 jan.wernecke@ptb.de, Gollwitzer, Christian1, Müller, Peter1, Krumrey, Michael1
Publikováno v:
Journal of Synchrotron Radiation. May2014, Vol. 21 Issue 3, p529-536. 8p.
Autor:
Wernecke, Jan
Ein Gebiet der Nanotechnologie ist die dimensionelle Nanometrologie, die sich mit der Messung von Längen in vertikale und laterale Richtung im nm-Bereich befasst. Messungen der Röntgenkleinwinkelstreuung unter streifendem Einfall (GISAXS) sind zers
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od_______793::ee3d0f175e417e63c16e07ff9b3ba601
http://depositonce.tu-berlin.de/handle/11303/4738
http://depositonce.tu-berlin.de/handle/11303/4738
PTB-Mitteilungen. Band 124 (2014), Heft 4, Seite 8 - 12. ISSN 0030-834X
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::37690d33f86ea573205a1754a90ce236
Autor:
Scholze, Frank, Laubis, Christian, Barboutis, Annett, Buchholz, Christian, Fischer, Andreas, Puls, Jana, Stadelhoff, Christian, Haase, Anton, Krumrey, Michael, Soltwisch, Victor, Wernecke, Jan, Garcia-Diez, Raul, Gollwitzer, Christian, Langner, Stefanie, Müller, Matthias, Gerlach, Martin, Holfelder, Ina, Hönicke, Philipp, Lubeck, Janin, Nutsch, Andreas, Pollakowski, Beatrix, Streeck, Cornelia, Unterumsberger, Rainer, Weser, Jan, Beckhoff, Burkhard, Hermann, Peter, Hoehl, Arne, Hornemann, Andrea, Kästner, Bernd, Müller, Ralph, Ulm, Gerhard, Kolbe, Michael, Darlatt, Erik, Fliegauf, Rolf, Kaser, Hendrik, Gottwald, Alexander, Richter, Mathias
PTB-Mitteilungen. Band 124 (2014), Heft 4. ISSN 0030-834X
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::95b016f2ee0abbd67efca56a63c4526e
Autor:
Saxena, Nitin, Čorić, Mihael, Greppmair, Anton, Wernecke, Jan, Pflüger, Mika, Krumrey, Michael, Brandt, Martin S., Herzig, Eva M., Müller‐Buschbaum, Peter
Publikováno v:
Advanced Electronic Materials; Aug2017, Vol. 3 Issue 8, pn/a-N.PAG, 14p
Publikováno v:
Surface & Interface Analysis: SIA; Oct/Nov2014, Vol. 46 Issue 10/11, p911-914, 4p