Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Wenkun, Tuo"'
Autor:
Hassan Nezhad Malihe, Xiao Wen, Sahab Uddin, Rogalsky Sergiy, Wenkun Tuo, Khodaei Behzad, Khoshzaban Fariba, Andrés Leire, P. de Oliveira Helinando, Mathew Bijo, Kishore Singh Amit, Nayeri Tooran, Md. Ashraf Ghulam, Hodyna Diana, Ghaffarifar Fatemeh, N. Uversky Vladimir, Weiming Wang, Kovalishyn Vasyl, Ghiasvand Fereshteh, Fernanda Sánchez-Guerrero Alma, Chen Fengyun, Wang Yang, Li Zhengming, M. da Costa Mateus, Metelytsia Larysa, Deli Yan, Alberto Castañón-González Jorge, Blagodatny Volodymyr, Huberman Alberto, Polanco Carlos, Dalimi Abdolhossein, Buhse Thomas, Shaohua Li, Seyedpour Simin, Semenyuta Ivan, Zhou Jiaogen, Lei Qiuliang, Perveen Asma, Kumar Das Pankoj, M.D. Soares Juliana, Tanvir Kabir, Bineshian Farahnaz, Seyed Alinaghi Seyed Ahmad, Kumar Shukla Awadhesh
Publikováno v:
Recent Advances in Electrical & Electronic Engineering (Formerly Recent Patents on Electrical & Electronic Engineering). 13:1087-1096
Background: The high permeability of Distributed Generation (DG) and the development of DC load represented by electric vehicle Battery Swapping Station (BSS) pose new challenges to the reliable and economic operation of DC distribution system. Metho
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bf9ac03993bc3b29535fedd17bacdc41
https://doi.org/10.2174/2352096513999200422142041
https://doi.org/10.2174/2352096513999200422142041
Autor:
Rui-Bin Zhao, Denglu Hou, Li-Yong Yuan, Jun-Jie Shen, Congmian Zhen, Hao Pan, Wenkun Tuo, Guoke Li, Li Ma, Liyun Jia, Qisong Sun
Publikováno v:
Journal of Magnetism and Magnetic Materials. 463:7-12
The magnetic and transport properties of e-Fe3−xN (0 ≤ x ≤ 1) films were systematically characterized to identify the correlation among the nitrogen concentration x, magnetic structure, and electrical transport properties. It was found that inc
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d842dc62670166cf219b0a02c24f5b40
https://doi.org/10.1016/j.jmmm.2018.05.017
https://doi.org/10.1016/j.jmmm.2018.05.017
Publikováno v:
Recent Advances in Electrical & Electronic Engineering; 2020, Vol. 13 Issue: 7 p1097-1106, 10p