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pro vyhledávání: '"Wen Wei Low"'
Publikováno v:
2016 IEEE Region 10 Conference (TENCON).
As memory technology scaling continues to advance to sub 20nm technology and memory capacity becomes higher, memory quality management becomes more challenging to achieve client's quality expectations especially in this new era of computing. Transfor
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::543c949140317e8b103c324eefbb187c
https://doi.org/10.1109/tencon.2016.7848472
https://doi.org/10.1109/tencon.2016.7848472
Publikováno v:
IEEE Transactions on Device & Materials Reliability; Jun2020, Vol. 20 Issue 2, p278-285, 8p
Autor:
FENG XUE, KELLY, MATT, GROSSKOPF, CURTIS, ZULPA, PAUL, CHII YEO, YVONNE, RON XIYUAN YIN, SOLIS, AGUSTIN, VELARDE, CARLOS NUNO, BARABAS, ZOLTAN
Publikováno v:
Printed Circuit Design & Fab: Circuits Assembly; Feb2019, Vol. 36 Issue 2, p30-38, 6p