Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Wei-pin Changchien"'
Autor:
Yu Hu, Wei-Pin Changchien, Sandeep C. Eruvathi, Ruifeng Guo, S. Pan, Liyang Lai, Ting-Pu Tai, Xiaowei Li, Jing Ye, Yu Huang, Charles C. C. Liu, Ji-Jan Chen, Daw-Ming Lee, Kartik K. Kumara, Wu-Tung Cheng
Publikováno v:
ITC
Without appropriate stitching of scan chains, even with good diagnosis algorithm and diagnostic pattern generation, the chain diagnostic resolution may still be bad. In this paper, we propose a novel pattern-independent diagnosis and layout aware (DL
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5fa2ef08b254145b5939c9f30c4f8919
https://doi.org/10.1109/test.2013.6651929
https://doi.org/10.1109/test.2013.6651929
Autor:
Chung-Sheng Yuan, Frank Lee, Ching-Fang Chen, Charles C. C. Liu, Ching-Shun Yang, Ji-Jan Chen, Wei-Pin Changchien, Yi-Lin Chuang
Publikováno v:
2013 IEEE 63rd Electronic Components and Technology Conference.
Interposer has emerged as a promising alternative of multiple-die integration to provide high-bandwidth transmission and smaller power consumption. However, few works study the design methodology to utilize interposer advantages and explore the relat
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a49bb07d5e8838c4fbca3667849007f0
https://doi.org/10.1109/ectc.2013.6575673
https://doi.org/10.1109/ectc.2013.6575673
Autor:
Nan-Hsin Tseng, James Chien-Mo Li, Wei-Li Hsu, Kuo-Yin Chen, Wei-Pin Changchien, Charles C. C. Liu, Po-Juei Chen
Publikováno v:
Asian Test Symposium
This paper presents a novel diagnosis algorithm for small delay defects (SDD). Faster-than-at-speed test sets are generated by masking long paths in the circuit for testing SDD. The proposed diagnosis technique uses timing upper and lower bound to im
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c247b71c67e9f97f4f3fc4be3aa5bfb6
https://doi.org/10.1109/ats.2011.23
https://doi.org/10.1109/ats.2011.23
Autor:
Po-Juei Chen, Wei-Li Hsu, Li, J.C.-M., Nan-Hsin Tseng, Kuo-Yin Chen, Wei-pin Changchien, Liu, C.C.C.
Publikováno v:
2011 20th Asian Test Symposium (ATS); 2011, p291-296, 6p