Zobrazeno 1 - 10
of 27
pro vyhledávání: '"Wei William Lee"'
Publikováno v:
IEEE Access, Vol 8, Pp 98600-98611 (2020)
In a large-scale data environment, the “curse of dimensionality” of high-dimensional feature spaces and the large amount of noisy data make the efficiency and accuracy of intrusion detection systems (IDSs) significantly decrease. To address these
Externí odkaz:
https://doaj.org/article/2fbda1d23e2b4340a455348689657c2c
Publikováno v:
Sensors, Vol 20, Iss 19, p 5710 (2020)
Owing to the constraints of time and space complexity, network intrusion detection systems (NIDSs) based on support vector machines (SVMs) face the “curse of dimensionality” in a large-scale, high-dimensional feature space. This study proposes a
Externí odkaz:
https://doaj.org/article/9c264766817e43b79ebd6ae5ef7daa57
Autor:
Wei William Lee, 李偉
92
This research explores the difference and similarity between Taiwan and China venture capital industry in post-investment management stages, as well as the expectations of portfolio companies to the VCs. The business stages are divided into f
This research explores the difference and similarity between Taiwan and China venture capital industry in post-investment management stages, as well as the expectations of portfolio companies to the VCs. The business stages are divided into f
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/74292447701705019401
Publikováno v:
Applied Physics A. 129
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d22ea6fbaa7f68d8952257816c25f94b
https://doi.org/10.1007/s00339-023-06476-6
https://doi.org/10.1007/s00339-023-06476-6
Publikováno v:
Sensors
Volume 20
Issue 19
Sensors, Vol 20, Iss 5710, p 5710 (2020)
Sensors (Basel, Switzerland)
Volume 20
Issue 19
Sensors, Vol 20, Iss 5710, p 5710 (2020)
Sensors (Basel, Switzerland)
Owing to the constraints of time and space complexity, network intrusion detection systems (NIDSs) based on support vector machines (SVMs) face the &ldquo
curse of dimensionality&rdquo
in a large-scale, high-dimensional feature space. This
curse of dimensionality&rdquo
in a large-scale, high-dimensional feature space. This
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::95a0261ce3d98c9e0d0823cd5db79699
Publikováno v:
Applied Surface Science. 206:321-330
The interactions between magnetron-sputtered Cu and PECVD amorphous SiCOF film have been studied via Auger electron spectroscopy (AES), X-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS), etc. At the initial sputtering deposition of c
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::af22e96330d2c4352213fda3f0cc6b40
https://doi.org/10.1016/s0169-4332(02)01234-5
https://doi.org/10.1016/s0169-4332(02)01234-5
Publikováno v:
Journal of Physics: Condensed Matter. 13:6595-6608
The interactions between magnetron-sputtered Cu and plasma-enhanced chemical-vapour-deposited a-SiCOF film have been investigated via x-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES) and scanning electron microscopy (SEM). Hi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a71c3bece93daf7f9819c1198e3bef0c
https://doi.org/10.1088/0953-8984/13/31/301
https://doi.org/10.1088/0953-8984/13/31/301
Autor:
Qing-Quang Zhang, David Wei Zhang, Wei William Lee, Shi-Jin Ding, Yong-Dong Zhou, Ji-Tao Wang
Publikováno v:
Applied Surface Science. 178:140-148
The interaction of low dielectric constant amorphous fluoropolymer (AF) film with evaporation-deposited aluminum has been investigated via high-resolution X-ray photoelectron spectroscopy (XPS). For the sake of gaining the interface of the Al/AF samp
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f84376fadd5ae10297c69c8d7c896b71
https://doi.org/10.1016/s0169-4332(01)00313-0
https://doi.org/10.1016/s0169-4332(01)00313-0
Publikováno v:
Chemical Vapor Deposition. 7:142-146
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::73e1b93cf6702012f5de3865b616842b
https://doi.org/10.1002/1521-3862(200107)7:4<142::aid-cvde142>3.0.co
https://doi.org/10.1002/1521-3862(200107)7:4<142::aid-cvde142>3.0.co
Publikováno v:
Applied Physics A Materials Science & Processing. 72:721-724
Amorphous SiCOF films with high carbon concentration are prepared by PECVD (plasma-enhanced CVD) with TEOS/C4F8/O2. The dielectric constant of (α-SiCOF film is reduced to 2.6 and other electric properties are improved remarkably. The moisture resist
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9b913268e9e8d516cb6ae86c5eb8e8cd
https://doi.org/10.1007/s003390000562
https://doi.org/10.1007/s003390000562