Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Weeks, T. W."'
Autor:
Helbig, Reinhard, Davis, Robert F., Ailey, K. S., Bremser, M. D., Carlson, E., Kern, R. S., Kester, D. J., Perry, W. G., Tanaka, S., Weeks, T. W.
Publikováno v:
Advances in Solid State Physics 35; 1995, p1-24, 24p
Autor:
Doverspike, K., Bulman, G. E., Sheppard, S. T., Kong, H. S., Leonard, M., Dieringer, H., Weeks, T. W., Edmond, J., Brown, J. D., Swindle, J. T., Schetzina, J. F., Song, Y- K, Kuball, M., Nurmikko, A.
Publikováno v:
MRS Online Proceedings Library; 1997, Vol. 482 Issue 1, p1129-1138, 10p
Publikováno v:
Applied Surface Science; 1996, Vol. 104 Issue: 1 p455-460, 6p
Spectroscopic ellipsometry and low-temperature reflectance: complementary analysis of GaN thin films
Autor:
Edwards, N. V., Yoo, S. D., Bremser, M. D., Horton, M. N., Perkins, N. R., Weeks, T. W., Liu, H., Stall, R. A., Kuech, T. F., Davis, R. F.
Publikováno v:
Thin Solid Films; 1998, Vol. 313 Issue: 1 p187-192, 6p
Publikováno v:
Applied Physics Letters; 9/30/1996, Vol. 69 Issue 14, p2065, 3p, 4 Graphs
Autor:
Song, Y.-K., Kuball, M., Nurmikko, A. V., Bulman, G. E., Doverspike, K., Sheppard, S. T., Weeks, T. W., Leonard, M., Kong, H. S., Dieringer, H., Edmond, J.
Publikováno v:
Applied Physics Letters; 3/23/1998, Vol. 72 Issue 12, 3 Diagrams