Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Wee-Leng Goh"'
Autor:
Chee Keong Chan, Wee Leng Goh
Publikováno v:
Engineering Applications of Artificial Intelligence. 3:186-197
The paper describes the development of an expert system for failure analysis and disposition of hard disk drives (ESHDD). A working prototype was implemented in the form of a run-time version and tried out on the production floor. Besides providing l
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e73e4964727ae12f3fa61c051f0d1deb
https://doi.org/10.1016/0952-1976(90)90041-j
https://doi.org/10.1016/0952-1976(90)90041-j
Publikováno v:
Proceedings of IECON '93 - 19th Annual Conference of IEEE Industrial Electronics.
This paper presents a novel method of recovering the three-dimensional information of objects using multispectral shadow information. In the method, multiple light sources of different power spectral distribution and illumination direction are concur
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2866ffef6f3d0fffdf19f692570002d2
https://doi.org/10.1109/iecon.1993.339336
https://doi.org/10.1109/iecon.1993.339336
Autor:
Wee Leng Goh, Dinesh P. Mital
Publikováno v:
Document Recognition and Retrieval
There is a considerable interest in designing automatic systems that can scan a given paper document and store it on electronic media for easier storage, manipulation and access. Most documents contain graphics and images, in addition to text. Thus,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e0531f193609cdacfe3aef77998a2868
https://doi.org/10.1117/12.335819
https://doi.org/10.1117/12.335819
Autor:
Wee Leng Goh, Dinesh P. Mital
Publikováno v:
SPIE Proceedings.
This paper describes an algorithm for detecting walls and openings in a maze from an image captured through a camera. The captured image is first transformed from 256 gray levels to a binary one, a procedure which extracts the edges of the walls of t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8e83af3f9f54a30e64b4b9ffdd76459b
https://doi.org/10.1117/12.138477
https://doi.org/10.1117/12.138477
Publikováno v:
Proceedings of IECON '93 - 19th Annual Conference of IEEE Industrial Electronics; 1993, p1736-1736, 1p
Conference
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