Zobrazeno 1 - 10
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pro vyhledávání: '"Weber, Joel C."'
Autor:
Spann, Bryan T., Weber, Joel C., Brubaker, Matt D., Harvey, Todd E., Yang, Lina, Honarvar, Hossein, Tsai, Chia-Nien, Treglia, Andrew C., Lee, M., Hussein, Mahmoud I., Bertness, Kris A.
Publikováno v:
Advanced Materials 35, 2209779 (2023)
Thermoelectric materials convert heat into electricity through thermally driven charge transport in solids, or vice versa for cooling. To be competitive with conventional energy-generation technologies, a thermoelectric material must possess the prop
Externí odkaz:
http://arxiv.org/abs/2301.04769
Autor:
Szypryt, Paul, Nakamura, Nathan, Becker, Daniel T., Bennett, Douglas A., Dagel, Amber L., Doriese, W. Bertrand, Fowler, Joseph W., Gard, Johnathon D., Harris, J. Zachariah, Hilton, Gene C., Imrek, Jozsef, Jimenez, Edward S., Larson, Kurt W., Levine, Zachary H., Mates, John A. B., McArthur, D., Miaja-Avila, Luis, Morgan, Kelsey M., O'Neil, Galen C., Ortiz, Nathan J., Pappas, Christine G., Schmidt, Daniel R., Thompson, Kyle R., Ullom, Joel N., Vale, Leila, Vissers, Michael R., Walker, Christopher, Weber, Joel C., Wessels, Abigail L., Wheeler, Jason W., Swetz, Daniel S.
Publikováno v:
IEEE Transactions on Applied Superconductivity, vol. 33, no. 5, pp. 1-5, Aug. 2023, Art no. 2100705
We report on the 1,000-element transition-edge sensor (TES) x-ray spectrometer implementation of the TOMographic Circuit Analysis Tool (TOMCAT). TOMCAT combines a high spatial resolution scanning electron microscope (SEM) with a highly efficient and
Externí odkaz:
http://arxiv.org/abs/2212.12073
Autor:
Nakamura, Nathan, Szypryt, Paul, Dagel, Amber L., Alpert, Bradley K., Bennett, Douglas A., Doriese, W. Bertrand, Durkin, Malcolm, Fowler, Joseph W., Fox, Dylan T., Gard, Johnathon D., Goodner, Ryan N., Harris, J. Zachariah, Hilton, Gene C., Jimenez, Edward S., Kernen, Burke L., Larson, Kurt W., Levine, Zachary H., McArthur, Daniel, Morgan, Kelsey M., O'Neil, Galen C., Ortiz, Nathan J., Pappas, Christine G., Reintsema, Carl D., Schmidt, Daniel R., Schultz, Peter A., Thompson, Kyle R., Ullom, Joel N., Vale, Leila, Vaughan, Courtenay T., Walker, Christopher, Weber, Joel C., Wheeler, Jason W., Swetz, Daniel S.
X-ray nanotomography is a powerful tool for the characterization of nanoscale materials and structures, but is difficult to implement due to competing requirements on X-ray flux and spot size. Due to this constraint, state-of-the-art nanotomography i
Externí odkaz:
http://arxiv.org/abs/2212.10591
Autor:
Szypryt, Paul, Bennett, Douglas A., Boone, William J., Dagel, Amber L., Dalton, Gabriella, Doriese, W. Bertrand, Fowler, Joseph W., Garboczi, Edward J., Gard, Johnathon D., Hilton, Gene C., Imrek, Jozsef, Jimenez, Edward S., Kotsubo, Vincent Y., Larson, Kurt, Levine, Zachary H., Mates, John A. B., McArthur, Daniel, Morgan, Kelsey M., Nakamura, Nathan, O'Neil, Galen C., Ortiz, Nathan J., Pappas, Christine G., Reintsema, Carl D., Schmidt, Daniel R., Swetz, Daniel S., Thompson, Kyle R., Ullom, Joel N., Walker, Christopher, Weber, Joel C., Wessels, Abigail L., Wheeler, Jason W.
Publikováno v:
in IEEE Transactions on Applied Superconductivity, vol. 31, no. 5, pp. 1-5, Aug. 2021, Art no. 2100405
Feature sizes in integrated circuits have decreased substantially over time, and it has become increasingly difficult to three-dimensionally image these complex circuits after fabrication. This can be important for process development, defect analysi
Externí odkaz:
http://arxiv.org/abs/2212.07460
Autor:
Yan, Daikang, Weber, Joel C., Guruswamy, Tejas, Morgan, Kelsey M., O'Neil, Galen C., Wessels, Abigail L., Bennett, Douglas A., Pappas, Christine G., Mates, John A., Gard, Johnathon D., Becker, Daniel T., Fowler, Joseph W., Swetz, Daniel S., Schmidt, Daniel R., Ullom, Joel N., Okumura, Takuma, Isobe, Tadaaki, Azuma, Toshiyuki, Okada, Shinji, Yamada, Shinya, Hashimoto, Tadashi, Quaranta, Orlando, Miceli, Antonino, Gades, Lisa M., Patel, Umeshkumar M., Paul, Nancy, Bian, Guojie, Indelicato, Paul
Superconducting transition-edge sensor (TES) microcalorimeters have great utility in x-ray applications owing to their high energy resolution, good collecting efficiency and the feasibility of being multiplexed into large arrays. In this work, we dev
Externí odkaz:
http://arxiv.org/abs/2207.10845
Akademický článek
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Autor:
Jones, Sarah Garcia, Materise, Nicholas, Leung, Ka Wun, Weber, Joel C., Isakov, Brian D., Chen, Xi, Zheng, Jiangchang, Gyenis, András, Jaeck, Berthold, McRae, Corey Rae H.
Publikováno v:
Journal of Applied Physics; 10/14/2023, Vol. 134 Issue 14, p1-8, 8p
Akademický článek
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Akademický článek
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Autor:
Nakamura, Nathan, Szypryt, Paul, Dagel, Amber L., Alpert, Bradley K., Bennett, Douglas A., Doriese, W. Bertrand, Durkin, Malcolm, Fowler, Joseph W., Fox, Dylan T., Gard, Johnathon D., Goodner, Ryan N., Harris, J. Zachariah, Hilton, Gene C., Jimenez, Edward S., Kernen, Burke L., Larson, Kurt W., Levine, Zachary H., McArthur, Daniel, Morgan, Kelsey M., O'Neil, Galen C., Ortiz, Nathan J., Pappas, Christine G., Reintsema, Carl D., Schmidt, Daniel R., Schulz, Peter A., Thompson, Kyle R., Ullom, Joel N., Vale, Leila, Vaughan, Courtenay T., Walker, Christopher, Weber, Joel C., Wheeler, Jason W., Swetz, Daniel S.
X-ray nanotomography has proven to be a powerful tool for the characterization of nanoscale materials and structures, such as energy storage devices and next-generation integrated circuits (ICs). In a nanotomography measurement the X-ray spot size mu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::86ab083455659a58c08cc938deb9e6db