Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Wayne K. Ford"'
Autor:
Arun Majumdar, Simon R. Phillpot, David G. Cahill, Kenneth E. Goodson, Gerald D. Mahan, Humphrey J. Maris, Wayne K. Ford, Roberto Merlin
Publikováno v:
Journal of Applied Physics. 93:793-818
Rapid progress in the synthesis and processing of materials with structure on nanometer length scales has created a demand for greater scientific understanding of thermal transport in nanoscale devices, individual nanostructures, and nanostructured m
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::86c9c9f73d6cf2268825a7a615358e42
https://doi.org/10.1063/1.1524305
https://doi.org/10.1063/1.1524305
Autor:
George Andrew Antonelli, Larry Wong, Ebrahim Andideh, Humphrey J. Maris, Wayne K. Ford, B. C. Daly
Publikováno v:
Journal of Applied Physics. 92:6005-6009
We report on measurements of the thermal conductivity of a number of amorphous materials, including fluorinated silicate glass and carbon-doped oxides. These materials are of interest to the microelectronics industry for use as insulators in micropro
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::834c5ffa41a1cff5db17d153b50d6835
https://doi.org/10.1063/1.1513882
https://doi.org/10.1063/1.1513882
Publikováno v:
Microelectronic Engineering. 35:37-40
Surface transport models proceeding via surface re-emission and surface diffusion are briefly described. The important dimensionless parameter for re-emission is the sticking probability, whereas for surface diffusion, profile evolution is governed b
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::447ad226aa871ef7de571de4e80d09b8
https://doi.org/10.1016/s0167-9317(96)00135-9
https://doi.org/10.1016/s0167-9317(96)00135-9
Autor:
Christopher J. Morath, Robert J. Stoner, G. Andrew Antonelli, Humphrey J. Maris, Guray Tas, Wayne K. Ford
Publikováno v:
AIP Conference Proceedings.
Picosecond ultrasonics has become a widely used metrology tool in the semiconductor device industry. It provides an accurate method for the measurement of the thickness of thin films, can determine the quality of the bonding between a film and a subs
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::69b4a8856f4cfc09e2d854a6effa40d5
https://doi.org/10.1063/1.2184531
https://doi.org/10.1063/1.2184531
Autor:
Wayne K. Ford
Publikováno v:
Surface Science Letters. 292:A614
A first implementation of a dynamical low-energy electron diffraction theory on a parallel supercomputer is described. The computational performance of the Duke-Laramore-Beeby LEED formulation is demonstrated using an Intel iPSC TM /860 parallel comp
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2ddc9ac6c469b1938e1b9b71e8b9dd2b
https://doi.org/10.1016/0167-2584(93)90892-m
https://doi.org/10.1016/0167-2584(93)90892-m