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Scanning Microscopy
Two pairs of diametrically opposed Schottky surface barrier diodes in a modified scanning electron microscope (SEM) are used to reconstruct surface elevations and composition differences. An empirically determined function of difference of signals fr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______1459::58a701874c8417b5cf2db57f385ee100
https://digitalcommons.usu.edu/microscopy/vol5/iss4/2
https://digitalcommons.usu.edu/microscopy/vol5/iss4/2