Zobrazeno 1 - 10
of 2 145
pro vyhledávání: '"Waser, R."'
By imitating the synaptic connectivity and plasticity of the brain, emerging electronic nanodevices offer new opportunities as the building blocks of neuromorphic systems. One challenge for largescale simulations of computational architectures based
Externí odkaz:
http://arxiv.org/abs/2205.05053
Resistive switching devices and other components with negative differential resistance (NDR) are emerging as possible electronic constituents of next-generation computing architectures. Due to the NDR effects exhibited, switching operations are stron
Externí odkaz:
http://arxiv.org/abs/2112.00192
Publikováno v:
Journal of Applied Physics; 6/21/2024, Vol. 135 Issue 23, p1-12, 12p
Autor:
Hennen, T., Wichmann, E., Elias, A., Lille, J., Mosendz, O., Waser, R., Wouters, D. J., Bedau, D.
Resistive switching devices, important for emerging memory and neuromorphic applications, face significant challenges related to control of delicate filamentary states in the oxide material. As a device switches, its rapid conductivity change is invo
Externí odkaz:
http://arxiv.org/abs/2102.05770
Publikováno v:
In Journal of the European Ceramic Society December 2022 42(15):7049-7062
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.
Autor:
Landini, S., Delgado-Diaz, W., Ravotti, R., Waser, R., Stamatiou, A., Worlitschek, J., O'Donovan, T.S.
Publikováno v:
In Applied Thermal Engineering August 2021 195
Autor:
Rodenbücher, C., Hildebrandt, E., Szot, K., Sharath, S. U., Kurian, J., Komissinskiy, P., Breuer, U., Waser, R., Alff, L.
Publikováno v:
Appl. Phys. Lett. 108, 25, 252903 (2016)
On highly oxygen deficient thin films of hafnium oxide (hafnia, HfO$_{2-x}$) contaminated with adsorbates of carbon oxides, the formation of hafnium carbide (HfC$_x$) at the surface during vacuum annealing at temperatures as low as 600 {\deg}C is rep
Externí odkaz:
http://arxiv.org/abs/1606.08227
Autor:
Rupp, J.A.J., Janod, E., Besland, M.-P., Corraze, B., Kindsmüller, A., Querré, M., Tranchant, J., Cario, L., Dittmann, R., Waser, R., Wouters, D.J.
Publikováno v:
In Thin Solid Films 1 July 2020 705
Publikováno v:
In Applied Thermal Engineering 5 June 2020 173