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pro vyhledávání: '"Wang, Dr. H. L."'
Autor:
Liu, Y., Sun, Q. M., Lu, Dr. W. H., Wang, Dr. H. L., Sun, Y., Wang, Z. T., Lu, X., Zeng, Prof. K. Y.
This paper develops a resolution enhancement method for post-processing the images from Atomic Force Microscopy (AFM). This method is based on deep learning neural networks in the AFM topography measurements. In this study, a very deep convolution ne
Externí odkaz:
http://arxiv.org/abs/1809.03704