Zobrazeno 1 - 10
of 24
pro vyhledávání: '"Wan-Yu Wen"'
Autor:
Wan-Yu Wen, 溫婉玉
97
The purposes of this study were to investigate the background factors, interpersonal relationship, self-esteem, hours of internet use, and internet addiction tendency among college students in Taiwan. The subjects were selected from college s
The purposes of this study were to investigate the background factors, interpersonal relationship, self-esteem, hours of internet use, and internet addiction tendency among college students in Taiwan. The subjects were selected from college s
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/z7n82m
Autor:
Gang Liu, Chao Li, Yan Liu, Chang-ming Zheng, Yu Ning, Hong-guo Yang, Lang Suo, Xin-zhang Qi, Hui-xin Li, Wan-yu Wen, Yu-hang Wang, Hong-yun Qi, Ping Cai, Ming-hao Gong
Publikováno v:
Applied Microbiology and Biotechnology. 106:6701-6711
Highland birds evolve multiple adaptive abilities to cope with the harsh environments; however, how they adapt to the high-altitude habitats via the gut microbiota remains understudied. Here we integrated evidences from comparative analysis of gut mi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::96b1dadbd98f314bdc0cb31d9c747b5d
https://doi.org/10.1007/s00253-022-12171-y
https://doi.org/10.1007/s00253-022-12171-y
Akademický článek
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Autor:
賴香如 Hsiang-Ru Lai, 李碧霞 Pi-Hsia Le, 卓俊辰 Jiun-Chen Jhuo, 呂昌明 Chang-Ming Lu, 溫婉玉 Wan-Yu Wen, 周維倫 Wei-Lun Chou
Publikováno v:
Journal of Research in Education Sciences, Vol 55, Iss 1, Pp 127-154 (2010)
國中是自尊發展的重要階段，學校可建構合宜教學指標以利提升學生的自尊。本研究採德懷術（Delphi technique）進行健康與體育領域的自尊教學指標建構。由一項全臺抽樣調查的620 名對象中
Externí odkaz:
https://doaj.org/article/58b0d2653ac7463bafab3998c271c1c4
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 34:577-588
In 3-D integrated circuits, through silicon via (TSV) is a critical enabling technique to provide vertical connections. However, it may suffer from many reliability issues such as undercut, misalignment, or random open defects. Various fault-toleranc
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0cbe1965dc8ac23251c1cd6e8a4b6ab1
https://doi.org/10.1109/tcad.2014.2385759
https://doi.org/10.1109/tcad.2014.2385759
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 33:1671-1680
In advanced IC manufacturing, as the gap increases between lithography optical wavelength and feature size, it becomes challenging to detect problematic layout patterns called lithography hotspot. In this paper, we propose a novel fuzzy matching mode
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bef8b38134e2734ba91c47b21ba570c9
https://doi.org/10.1109/tcad.2014.2351273
https://doi.org/10.1109/tcad.2014.2351273
Publikováno v:
ASP-DAC
Low power design techniques have been extensively applied in modern IC designs to avoid negative side effects from high power density. Unlike Dynamic Voltage and/or Frequency Scaling (DVFS) approaches only applied on a “fixed” design, we propose
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c358720f307df7f7cc180a79fc8ad40e
https://doi.org/10.1109/aspdac.2016.7428019
https://doi.org/10.1109/aspdac.2016.7428019
Publikováno v:
ISPD
Dynamic voltage scaling (DVS) has been widely used to suppress power consumption in modern designs. The decision of optimal operating voltage at runtime should consider the variations in workload, process as well as environment. As these variations a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8fd748f4d855d52f0e0317b059451c5a
https://doi.org/10.1145/2717764.2717765
https://doi.org/10.1145/2717764.2717765
Publikováno v:
DAC
Sub-threshold designs play an important role in energy-constrained applications. In those designs, path delays depend exponentially on threshold voltage/temperature. As such, dynamic configurations at runtime are desired for best trade-off between op
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::15b916f71b1823c9a98eca0a2bb9901b
https://doi.org/10.1145/2593069.2593115
https://doi.org/10.1145/2593069.2593115
Publikováno v:
DAC
In advanced IC manufacturing, as the gap between lithography optical wavelength and feature size increases, it becomes challenging to detect problematic layout patterns called lithography hotspot. In this paper, we propose a novel fuzzy matching mode
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::16befe08047c2a3ad26af2ce2caa98da
https://doi.org/10.1145/2463209.2488817
https://doi.org/10.1145/2463209.2488817