Zobrazeno 1 - 10
of 14
pro vyhledávání: '"Wan-Yen Lin"'
Autor:
Jam-Wem Lee, Ming-Hsiang Song, Chia-Wei Hsu, Yi-Feng Chang, Chua-Chin Wang, Wan-Yen Lin, Chih-Lin Chen, Yi Hu, Zong-You Hou
Publikováno v:
IEEE Transactions on Circuits and Systems I: Regular Papers. 62:752-760
In this paper, a 60 V tolerance transceiver with ESD (electrostatic discharge) protection is proposed for FlexRay-based communication systems. The FlexRay transceiver comprises three protective devices, including an over-voltage detector, high-voltag
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8ac78817329c546f71fec37cdc4121c4
https://doi.org/10.1109/tcsi.2014.2370192
https://doi.org/10.1109/tcsi.2014.2370192
Publikováno v:
Microelectronics Reliability. 54:71-78
A new silicon controlled rectifier (SCR)-based transient detection circuit for on-chip protection design against system-level electrical transient disturbance is proposed. The circuit function to detect positive or negative electrical transients duri
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::99092b67a9150c7d9b1b16e4fba070cc
https://doi.org/10.1016/j.microrel.2013.08.010
https://doi.org/10.1016/j.microrel.2013.08.010
Autor:
Wan-Yen Lin, Ming-Dou Ker
Publikováno v:
NEWCAS
A new SCR-based transient detection circuit for on-chip protection design against system-level ESD-induced electrical transient disturbance is proposed and verified in silicon chip. The experimental results in a 0.18-µm CMOS process have confirmed t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b814ea09f61c146455220c10d2307ead
https://doi.org/10.1109/newcas.2012.6328961
https://doi.org/10.1109/newcas.2012.6328961
Publikováno v:
2011 IEEE International Conference on IC Design & Technology.
New on-chip 4-bit transient-to-digital converter for electrical fast transient (EFT) protection design has been proposed. The converter is designed to detect EFT-induced transient disturbances and transfer different EFT voltages into digital codes un
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ad454f465df8bc62ae83e0aae8cead8a
https://doi.org/10.1109/icicdt.2011.5783183
https://doi.org/10.1109/icicdt.2011.5783183
Publikováno v:
2011 6th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS).
A new transient detection circuit against system-level electrostatic discharge (ESD) transient disturbance is proposed for display panel protection. The circuit function to detect positive or negative electrical transients under system-level ESD test
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0e5b99dee6067d6a798aef4e63eccf2f
https://doi.org/10.1109/dtis.2011.5941441
https://doi.org/10.1109/dtis.2011.5941441
Publikováno v:
2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology.
A new on-chip CR-based electrostatic discharge (ESD) detection circuit for system-level ESD protection design is proposed in this work. The circuit performance to detect positive or negative electrical transients generated by system-level ESD tests h
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2f467562370c432eee85aff2675ba586
https://doi.org/10.1109/icsict.2010.5667447
https://doi.org/10.1109/icsict.2010.5667447
Publikováno v:
2010 IEEE International Conference on Integrated Circuit Design and Technology.
A new transient detection circuit against electrical fast transient (EFT) disturbance is proposed for display panel protection. The circuit function to detect positive or negative electrical transients under EFT tests has been investigated in HSPICE
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ca47f31f8e41c00340e7ce2485d3efa8
https://doi.org/10.1109/icicdt.2010.5510297
https://doi.org/10.1109/icicdt.2010.5510297
Publikováno v:
2010 Asia-Pacific International Symposium on Electromagnetic Compatibility.
A hardware/firmware system co-design has been proposed in this work to protect display electronic products against system-level electrostatic discharge (ESD) transient disturbance. By including transient detection circuit, the firmware can execute sy
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b791345b132810ef1662fb75098b51fb
https://doi.org/10.1109/apemc.2010.5475821
https://doi.org/10.1109/apemc.2010.5475821
Publikováno v:
Journal of Physics: Conference Series. 301:012053
A new on-chip detection circuit is proposed for electrical fast transient (EFT) protection design in a display system. For microelectronic products, electrical transient disturbances often cause upset or frozen states under the IEC test standard. The
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::04d7ea27b35f5b467c1e0922dc1f2422
https://doi.org/10.1088/1742-6596/301/1/012053
https://doi.org/10.1088/1742-6596/301/1/012053
Publikováno v:
2011 IEEE International Conference on IC Design & Technology (ICICDT); 2011, p1-4, 4p