Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Walt Wriggins"'
Publikováno v:
MRS Advances. 7:1441-1444
Publikováno v:
2018 22nd International Conference on Ion Implantation Technology (IIT).
Wear effects are evaluated in spinning wheel wafer fixture components made from Al and Torlon materials exposed to high current ion beam exposures and over 350,000 wafer moves over extended time periods. Metrologies used include: (1) optical and SEM
Publikováno v:
2014 20th International Conference on Ion Implantation Technology (IIT).
Wafer/pad temperatures are measured for various elastomer materials for control of wafer temperatures during high-power implantation to less than 40 C. Wafer/pad temperatures during and directly following implant are monitored by in-situ IR sensors a