Zobrazeno 1 - 10
of 15
pro vyhledávání: '"Wah Pheng Lee"'
Autor:
Samuel Ching Xin Ren, Jun Kit Chaw, Yee Mei Lim, Wah Pheng Lee, Tin Tin Ting, Cheng Weng Fong
Publikováno v:
Applied Sciences, Vol 12, Iss 13, p 6499 (2022)
This paper aims to investigate the optimal sorting of orders reflecting on the material changing lead time over the machines in the roofing manufacturing industry. Specifically, a number of jobs were sorted together based on the material used and the
Externí odkaz:
https://doaj.org/article/8d4e5cd3502e4b5093596514b8d1037b
Autor:
Jen Hin Hang, Donovan Sheldon Charles, Zheng Hung Gan, Sze Kai Gan, Yee Mei Lim, Wah Pheng Lee, Thein Lai Wong, Ching Pang Goh
Publikováno v:
Information, Vol 13, Iss 2, p 56 (2022)
Mass individualized production refers to the mass production of individualized products. It becomes important for delivering a personalized customer experience in the Industrial Revolution 4.0 era. Developing seamless value chain integration between
Externí odkaz:
https://doaj.org/article/4b5c6a0c57374014a07581f9dea9c425
Autor:
Chi Wee Tan, Joren Mundane Antequisa Pacaldo, Wah Pheng Lee, Gloria Jennis Tan, Siaw Lang Wong, Jun Kit Chaw
Publikováno v:
Lecture Notes of the Institute for Computer Sciences, Social Informatics and Telecommunications Engineering ISBN: 9783031302367
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::426d19d0dcde890a422ac37a8cb2811d
https://doi.org/10.1007/978-3-031-30237-4_4
https://doi.org/10.1007/978-3-031-30237-4_4
Autor:
Khai Min Chew, Wah Pheng Lee
Publikováno v:
The Journal of The Institution of Engineers, Malaysia. 82
The RAMI4.0 model consists of three axes; the Layers axis, the Hierarchy axis, and the Life Cycle Value Stream axis. This model unifies the various aspects of I4.0 to allow data generated from manufacturing and business activities to be shared effect
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5f70a990fcca6b639fe3cc049756285f
https://doi.org/10.54552/v82i3.120
https://doi.org/10.54552/v82i3.120
Publikováno v:
2021 3rd International Conference on Computer Communication and the Internet (ICCCI).
Mass production of individualized products becomes essential for delivering personalized customer experience in the Industrial Revolution 4.0 era. Developing seamless value chain integration between enterprises, such as suppliers, retailers, and manu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ea0e8175dc03a966fa1296cb0261544f
https://doi.org/10.1109/iccci51764.2021.9486787
https://doi.org/10.1109/iccci51764.2021.9486787
Publikováno v:
WF-IoT
The environmental and agricultural monitoring system used the Internet of Things (IoT) Technologies and computer vision to tackle the agriculture sector problems by using an actual farm site and real-time crops monitoring solution as a test bed. Vari
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::76dc172b4bc039eac578c2f0d1e7d3bb
https://doi.org/10.1109/wf-iot51360.2021.9595962
https://doi.org/10.1109/wf-iot51360.2021.9595962
Publikováno v:
TALE
Digital disruption creates a lot of new entrepreneurship opportunities, affecting existing businesses at a very fast pace. Therefore using traditional classroom method to teach entrepreneurship to only business schools students no longer applicable.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cb0729dab4ef4af14f045b160bbf5558
https://doi.org/10.1109/tale48000.2019.9225964
https://doi.org/10.1109/tale48000.2019.9225964
Publikováno v:
IEEE Transactions on Semiconductor Manufacturing. 17:422-431
Dark-field optical scattering technique is adopted in a surface defect detection system (DDS) to allow an efficient and cost-effective detection and size determination of the crystal originated "particles" (COPs) on polished silicon wafer surface bef
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::91487417ea270ab2fff311ef9efa9c4f
https://doi.org/10.1109/tsm.2004.831531
https://doi.org/10.1109/tsm.2004.831531
Autor:
Wah-Pheng Lee1 wplee@sehmy.com, Ho-Kwang Yow2 hkyow@mmu.edu.my, Teck-Yong Tou2 tytou@mmu.edu.my
Publikováno v:
IEEE Transactions on Semiconductor Manufacturing. Aug2004, Vol. 17 Issue 3, p422-431. 10p.
Publikováno v:
Electrochemical and Solid-State Letters. 8:J5
A surface particle localization system based on oblique angle dark field optical scattering has been incorporated into time-of-flight secondary ion mass spectrometry. (TOF-SIMS) In this design, oblique incident laser light would be scattered to all d
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::db5dc529edcce310bd61eb5802a31272
https://doi.org/10.1149/1.1857691
https://doi.org/10.1149/1.1857691