Zobrazeno 1 - 10
of 19
pro vyhledávání: '"Waayers, Tom"'
Autor:
Von Staudt, Hans-Martin, Portolan, Michele, Cote, J.F, Waayers, Tom, Rearick, Jeff, Keim, Martin
Publikováno v:
UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)
Universitat Politècnica de Catalunya (UPC)
IEEE 1687-2014 gained traction in the test community very fast. Numerous innovations, publications, and implementations have been described, from both, industry and academia. Today, 7 years plus a few months after the release of the standard, much of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::cb1cfd225c204a00d03a22ffb7c95e0c
https://hdl.handle.net/2117/372284
https://hdl.handle.net/2117/372284
IEEE 1687-2014 gained traction in the test community very fast. Numerous innovations, publications, and implementations have been described, from both, industry and academia. Today, 7 years plus a few months after the release of the standard, much of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od_______166::b97e0347fd4f9d2f502cb49ee6c73bc0
https://hal.archives-ouvertes.fr/hal-03780250
https://hal.archives-ouvertes.fr/hal-03780250
Publikováno v:
2013 Euromicro Conference on Digital System Design; 2013, p453-461, 9p
Publikováno v:
Core Test Wrapper Handbook; 2006, p249-272, 24p
Publikováno v:
Core Test Wrapper Handbook; 2006, p221-248, 28p
Publikováno v:
Core Test Wrapper Handbook; 2006, p217-220, 4p
Publikováno v:
Core Test Wrapper Handbook; 2006, p187-216, 30p
Publikováno v:
Core Test Wrapper Handbook; 2006, p77-129, 53p
Publikováno v:
Core Test Wrapper Handbook; 2006, p29-76, 48p