Výsledky vyhledávání - "WJ MoberlyChan"

Surface Rippling & Ion Etch Yields of Diamond Using a Focused Ion Beam: With or Without Enhanced-Chemistry, Aspect Ratio Regulates Ion Etching

Autor: T. E. Felter, Mark A. Wall, WJ MoberlyChan

Publikováno v: Microscopy Today. 14:28-35

The Focused Ion Beam (FIB) instrument, originally designed for semiconductor circuit modification and repair, has found considerable utility as a tool for specimen preparation in several microscopy disciplines and for micromachining small parts. Esse

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ebf07d1f85f6c632d5ea121e6929e41a
https://doi.org/10.1017/s1551929500058855

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Role of Planar Defects in Compound Semiconductor Crystals: From Growth of Nanomasts & Nanosails to Processing Light Emission in DualBeam FIB/SEM

Autor: Ilan Shalish, Venkatesh Narayanamurti, WJ MoberlyChan, J Tringe

Publikováno v: Microscopy and Microanalysis. 13

When crystals are made smaller than a grain, grain boundaries and 3-dimensional defects are no longer a concern. The free surfaces of nanometer-scale crystals dominate the energy considerations, and even the strain energy of 1dimensional defects cann

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::53bae3bfce8d37b773ba6ae7fa9cf89c
https://doi.org/10.1017/s1431927607073564

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Self-Organized Topologies Above & Below Surfaces by FIB: From NanoWave & Surface Defect Motion, to Taking Re out of Redep, to Quantized Picostructures

Autor: WJ MoberlyChan

Publikováno v: Microscopy and Microanalysis. 13

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::36fcb470f0bb0b772c231f3a1809b536
https://doi.org/10.1017/s1431927607073527

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Cryo FIB Applications: Metallographic Etching of Biological Materials; Cryolithography with Ice as an Environmentally Friendly Photoresist

Autor: Andrew M. Minor, S Reyntjens, WJ MoberlyChan

Publikováno v: Microscopy and Microanalysis. 12:1268-1269

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::82c3f2e982f0db71cdcd066e0da8b4a9
https://doi.org/10.1017/s1431927606064063

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Akademický článek

Nanoscale zirconia as a nonmetallic catalyst for graphitization of carbon and growth of single- and multiwall carbon nanotubes.

Autor: Steiner SA 3rd; Department of Aeronautics and Astronautics, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA. ssteiner@alum.mit.edu, Baumann TF, Bayer BC, Blume R, Worsley MA, MoberlyChan WJ, Shaw EL, Schlögl R, Hart AJ, Hofmann S, Wardle BL

Publikováno v: Journal of the American Chemical Society [J Am Chem Soc] 2009 Sep 02; Vol. 131 (34), pp. 12144-54.

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Akademický článek

Dual-beam focused ion beam/electron microscopy processing and metrology of redeposition during ion-surface 3D interactions, from micromachining to self-organized picostructures.

Autor: Moberlychan WJ; Lawrence Livermore National Laboratories, CMELS, Livermore, CA, USA.

Publikováno v: Journal of physics. Condensed matter : an Institute of Physics journal [J Phys Condens Matter] 2009 Jun 03; Vol. 21 (22), pp. 224013. Date of Electronic Publication: 2009 May 12.

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Akademický článek

Synthesis of nearly monodisperse embedded nanoparticles by separating nucleation and growth in ion implantation.

Autor: Ramaswamy V; Division of Engineering and Applied Sciences, Harvard University, Cambridge, Massachusetts, USA., Haynes TE, White CW, MoberlyChan WJ, Roorda S, Aziz MJ

Publikováno v: Nano letters [Nano Lett] 2005 Feb; Vol. 5 (2), pp. 373-7.

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