Zobrazeno 1 - 10
of 150
pro vyhledávání: '"WITHERS, J.C."'
Publikováno v:
In Journal of Nuclear Materials December 2000 283-287 Part 1:570-573
Autor:
Withers, J.C.1 (AUTHOR) jcwithers@mercorp.com, Storm, R.1 (AUTHOR), Shapovalov, V.1 (AUTHOR), Loutfy, R.O.1 (AUTHOR)
Publikováno v:
Materials & Manufacturing Processes. Aug2012, Vol. 27 Issue 8, p878-881. 4p. 2 Color Photographs, 1 Black and White Photograph, 2 Diagrams.
Autor:
WITHERS, J.C.
Publikováno v:
Aslib Proceedings, 1952, Vol. 4, Issue 2, pp. 95-100.
Externí odkaz:
http://www.emeraldinsight.com/doi/10.1108/eb049434
Autor:
Storm, R.1 (AUTHOR) rstorm@mercorp.com, Withers, J.C.1 (AUTHOR), Ramos, R.1 (AUTHOR), Loutfy, R.O.1 (AUTHOR)
Publikováno v:
Materials & Manufacturing Processes. Aug2012, Vol. 27 Issue 8, p875-877. 3p. 6 Black and White Photographs.
Autor:
McBranch, D., Smilowitz, L., Klimov, V., Koskelo, A., Robinson, J.M., Mattes, B.R., Hummelen, J.C., Wudl, F., Withers, J.C., Borrelli, N.F.
Publikováno v:
Host Publication, 2530, 196-204
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=narcis______::fa61abc3022490686854dc6f8349a0fa
https://research.rug.nl/en/publications/c67c543a-0a9a-4f75-bcfe-1908a5b9a4fd
https://research.rug.nl/en/publications/c67c543a-0a9a-4f75-bcfe-1908a5b9a4fd
Single-shell carbon nanotubes, approximately 1 nm in diameter, have been imaged for the first time by atomic force microscopy operating in both the contact and tapping modes. For the contact mode, the height of the imaged nanotubes has been calibrate
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od_______610::efe1fbe06ea3c63098e0b0463bab81d6
https://publica.fraunhofer.de/handle/publica/185253
https://publica.fraunhofer.de/handle/publica/185253
Publikováno v:
2005 IEEE Aerospace Conference; 2005, p718-723, 6p
Publikováno v:
Proceedings, IEEE Aerospace Conference; 2002, p5-2423, 2419p
Publikováno v:
Proceedings, IEEE Aerospace Conference; 2002, p3-1389, 1387p
Publikováno v:
Sixteenth Annual IEEE Semiconductor Thermal Measurement & Management Symposium (Cat. No.00CH37068); 2000, p195-200, 6p