Zobrazeno 1 - 10
of 1 748
pro vyhledávání: '"WISE, DAVID"'
Autor:
Chittock-Wood, Jacob F., Leon, Ross C. C., Fogarty, Michael A., Murphy, Tara, Patomäki, Sofia M., Oakes, Giovanni A., von Horstig, Felix-Ekkehard, Johnson, Nathan, Jussot, Julien, Kubicek, Stefan, Govoreanu, Bogdan, Wise, David F., Gonzalez-Zalba, M. Fernando, Morton, John J. L.
Leveraging the advanced manufacturing capabilities of the semiconductor industry promises to help scale up silicon-based quantum processors by increasing yield, uniformity and integration. Recent studies of quantum dots fabricated on 300 mm wafer met
Externí odkaz:
http://arxiv.org/abs/2408.01241
Autor:
Thomas, Edward J., Ciriano-Tejel, Virginia N., Wise, David F., Prete, Domenic, de Kruijf, Mathieu, Ibberson, David J., Noah, Grayson M., Gomez-Saiz, Alberto, Gonzalez-Zalba, M. Fernando, Johnson, Mark A. I., Morton, John J. L.
Quantum computers are nearing the thousand qubit mark, with the current focus on scaling to improve computational performance. As quantum processors grow in complexity, new challenges arise such as the management of device variability and the interfa
Externí odkaz:
http://arxiv.org/abs/2310.20434
Autor:
von Horstig, Felix-Ekkehard, Ibberson, David J., Oakes, Giovanni A., Cochrane, Laurence, Wise, David F., Stelmashenko, Nadia, Barraud, Sylvain, Robinson, Jason A. W., Martins, Frederico, Gonzalez-Zalba, M. Fernando
Fast measurements of quantum devices is important in areas such as quantum sensing, quantum computing and nanodevice quality analysis. Here, we develop a superconductor-semiconductor multi-module microwave assembly to demonstrate charge state readout
Externí odkaz:
http://arxiv.org/abs/2304.13442
Autor:
Meneses, Fernando, Wise, David F., Pagliero, Daniela, Zangara, Pablo R., Dhomkar, Siddharth, Meriles, Carlos A.
Publikováno v:
Phys. Rev. Appl. 18, 024004 (2022)
Recent progress in the application of color centers to nanoscale spin sensing makes the combined use of noise spectroscopy and scanning probe imaging an attractive route for the characterization of arbitrary material systems. Unfortunately, the tradi
Externí odkaz:
http://arxiv.org/abs/2208.01107