Zobrazeno 1 - 10
of 56
pro vyhledávání: '"W.K. Yeh"'
Publikováno v:
Extended Abstracts of the 2018 International Conference on Solid State Devices and Materials.
Publikováno v:
Extended Abstracts of the 2018 International Conference on Solid State Devices and Materials.
Publikováno v:
IEEE Transactions on Magnetics. 33:3415-3417
The microwave sintering (ms) process is observed to be superior to conventional sintering (cs) in the densification of Y/sub 3/Fe/sub 5/O/sub 12/ materials. A density of 97.3% theoretical density (T.D.) with pure garnet phase and small grain size (5/
Publikováno v:
1997 IEEE International Magnetics Conference (INTERMAG'97).
Autor:
C.C. Liu, C. Chen, Y.C. Ku, H.S. Huang, M.S. Yang, S.W. Sun, K.T. Huang, W.K. Yeh, J.W. Chou, T. Lin, J.Y. Wu, S.Y. Hsu, Water Lur, T.R. Yew, M.J. Tsai, C.H. Huang
Publikováno v:
1998 Semiconductor Manufacturing Technology Workshop (Cat. No.98EX133).
An advanced 0.25-0.18 /spl mu/m CMOS technology with fully-planarized 6-level-interconnect has been developed for versatile, flexible, and fast turn-around foundry manufacturing. A 0.6 /spl mu/m layout pitch has been successfully demonstrated for act
Publikováno v:
2000 IEEE International SOI Conference. Proceedings (Cat. No.00CH37125).
The partially depleted SOI MOSFET (PD-SOI) has been found to be an attractive device due to advantages such as full dielectric isolation and reduced junction capacitance compared to the bulk Si device (Assaderaghi et al, 1997; Maeda et al, 2000). How
Autor:
V. Blaschke, C.H. Yu, W.K. Yeh, Ming-Hsing Tsai, M.S. Liang, Ennis T. Ogawa, Paul S. Ho, R. Augur, R.H. Havemann, Shau-Lin Shue
Publikováno v:
Proceedings of the IEEE 2001 International Interconnect Technology Conference (Cat. No.01EX461).
Electromigration (EM) characteristics were evaluated for multilevel copper test structures embedded in a CVD SiOC low k inter-metal dielectric. After electromigration stress testing, Cu extrusion along the interface between SiOC and the SiN dielectri
Publikováno v:
Journal of Biological Chemistry. 256:2723-2730
Cells of Pseudomonas putida, after growth with toluene, contain a multicomponent enzyme system that oxidizes toluene to (+)-1(S),2(R)-dihydroxy-3-methyl-cyclohexa-3,5-diene. One of these components has been purified to homogeneity and shown to be a f
Publikováno v:
Journal of Biological Chemistry. 260:2355-2363
Toluene dioxygenase oxidizes toluene to (+)-cis-1(S),2(R)-dihydroxy-3-methylcyclohexa-3,5-diene. This reaction is catalyzed by a multienzyme system that is induced in cells of Pseudomonas putida F1 during growth on toluene. One of the components of t
Publikováno v:
Biochemical and Biophysical Research Communications. 78:401-410
Pseudomonas putida oxidizes toluene through (+)-cis-1(S),2(R)-dihydroxy-3-methylcyclohexa-3,5-diene (cis-toluene dihydrodiol). The enzyme catalyzing this reaction was resolved into three protein components. Maximal enzymatic activity was dependent on