Zobrazeno 1 - 10
of 33
pro vyhledávání: '"W.J. Kloosterman"'
Publikováno v:
2014 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM).
This paper presents an extensive method to determine the extraction region were the method (published earlier) that consistently accounts for self-heating and Early effect to accurately extract both base and thermal resistance of bipolar junction tra
Publikováno v:
IEEE Journal of Solid-State Circuits. 36:1390-1398
The collector epilayer is a crucial element in the behavior of modern bipolar transistors. Compact models for its description, like the Kull model, are therefore of crucial importance too. We give a Mextram-based improvement to these models for quasi
Publikováno v:
2013 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM).
We extend the category of parameter extraction methods that utilize weak avalanche under fixed emitter current conditions to extract base resistance. Our new method consistently accounts for self-heating and Early effect so as to arrive at an accurat
Publikováno v:
IEEE Transactions on Electron Devices. 39:2553-2561
A lateral p-n-p compact model, suitable for computer-aided circuit design purposes, is introduced. In this formulation, called MODELLA, the equivalent circuit topology, analytical equations, and model parameters are derived directly from the physics
Publikováno v:
IEEE Transactions on Electron Devices. 39:2090-2098
An analytical model describing reverse and forward DC characteristics is presented. It serves as a basis for a compact model for circuit simulation purposes. The model is based on the solution of the hole continuity equation in the depletion layer of
Autor:
W.J. Kloosterman, A.C.T. Aarts
Publikováno v:
IEEE Transactions on Electron Devices, 53(4), 897-902. Institute of Electrical and Electronics Engineers
The surface-potential-based compact transistor model, MOS Model 20 (MM20), has been extended with a quasi-saturation, an effect that is typical for LDMOS devices with a long drift region. As a result, MM20 extends its application range from low-volta
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6e8d6192984d40a96dd19ec1af5c6fe1
https://research.tue.nl/nl/publications/5a668343-81d0-40e0-89c1-e20d02b35c76
https://research.tue.nl/nl/publications/5a668343-81d0-40e0-89c1-e20d02b35c76
Publikováno v:
Proceedings of the 1999 Bipolar/BiCMOS Circuits and Technology Meeting (Cat. No.99CH37024).
The base- and emitter resistance are important parameters of bipolar transistors and can be extracted from high frequency small signal admittance (Y) parameters. The circle impedance method and the two port method are examined and improvements are pr
Publikováno v:
Proceedings of the Bipolar Circuits and Technology Meeting.
The improved performance of the compact bipolar transistor model MEXTRAM is demonstrated by comparison with Gummel-Poon (GP) model calculations and measured DC and high-frequency data. The MEXTRAM model contains extended modeling of the collector epi
Publikováno v:
Proceedings of Bipolar/Bicmos Circuits and Technology Meeting.
A very fast, robust and accurate parameter extraction method for bipolar compact models has been developed. Using a combination of simplified expressions and selected measurements the iterative solution of the full model equations (e.g. using a circu
Publikováno v:
Proceedings of the 2001 BIPOLAR/BiCMOS Circuits and Technology Meeting (Cat. No.01CH37212).
We present compact model formulations for the description of two effects seen in SiGe HBT's, but not in pure-Si transistors. One of them is the influence on the Early effect of a graded Ge-content in the base. The other is the neutral base recombinat