Výsledky vyhledávání - "W.A. Jordaan"

Chemical, electronic and nanostructural properties of nanocrystalline silicon synthesised by hot-wire CVD

Autor: T.F.G. Muller, Oelof Kruger, Franscious Cummings, Refuoe Pepenene, W.A. Jordaan, C.J. Oliphant, Christopher J. Arendse

Publikováno v: physica status solidi (a). 213:1705-1709

This study examines the correlation between the chemical, electronic and optical properties of a nanocrystalline silicon thin film fabricated by hot-wire chemical vapour deposition. The locations of porosity and the incubation layer of the thin film

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::b4832ba4c3a99f8925f0b1edb4da65c6
https://doi.org/10.1002/pssa.201532974

Zobrazit plný text záznamu

Raman analysis of bilayer graphene film prepared on commercial Cu(0.5 at% Ni) foil

Autor: Abdulhakeem Bello, T.M. Masikhwa, W.A. Jordaan, Julien K. Dangbegnon, C.J. Oliphant, Ncholu I. Manyala, Moshawe J. Madito, Damilola Y. Momodu

Publikováno v: Journal of Raman Spectroscopy. 47:553-559

The South African Research Chairs Initiative of the Department of Science and Technology and National Research Foundation (NRF) of South Africa (grant no. 97994). M.J. Madito acknowledges the financial support from University of Pretoria and NRF for

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::6633e1dc60b25e7384e186b07cfde5d0
https://doi.org/10.1002/jrs.4848

Zobrazit plný text záznamu

Degradation of a tantalum filament during the hot-wire CVD of silicon nitride thin films

Autor: T.F.G. Muller, D. Knoesen, C.J. Oliphant, Christopher J. Arendse, W.A. Jordaan

Publikováno v: Thin Solid Films. 575:42-46

Electron backscatter diffraction revealed that during the hot-wire deposition of silicon nitride, a tantalum filament partially transformed to some of its nitrides and silicides. The deposition of an encapsulating silicon nitride layer occurred at th

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::a8e902ef3eb444e528eb3d4f1beb0850
https://doi.org/10.1016/j.tsf.2014.10.012

Zobrazit plný text záznamu

Evolution of the chemical composition of Sn thin films heated during x-ray photoelectron spectroscopy

Autor: C.J. Oliphant, Fortunate Modiba, Christopher J. Arendse, Louise Mostert, W.A. Jordaan

Publikováno v: Surfaces and Interfaces. 17:100378

High-vacuum XPS have been used to analyse the surface modification of a 3 nm-thick Sn thin film on Si (100) before and after annealing up to 450 °C. Increasing the XPS stage temperature led to a reduction in the amount of surface Sn and increasing a

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::6033aa040881767f69d5486a46edc5df
https://doi.org/10.1016/j.surfin.2019.100378

Zobrazit plný text záznamu

Role of oxide thickening in fatigue crack initiation in LIGA nickel MEMS thin films

Autor: W.A. Jordaan, Yong Yang, K.T. Hillie, Wole Soboyejo, Wanliang Shan

Publikováno v: Materials Science and Engineering: A. 561:434-440

This paper presents the results of a combined experimental and theoretical study of the fatigue crack initiation in LIGA Ni thin films with a thickness of 270 μ m . The potential roles of surface oxide thickening and slip bands are explored for fati

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::ab212370bdb7049a75be909a8f95b4ac
https://doi.org/10.1016/j.msea.2012.10.057

Zobrazit plný text záznamu

Characterization of Y2SiO5:Ce thin films

Autor: Jacobus J. Terblans, Ulrich Buttner, Odireleng M. Ntwaeaborwa, W.A. Jordaan, K. T. Hillie, Elizabeth Coetsee, Hendrik C. Swart

Publikováno v: Optical Materials. 29:1338-1343

Uncoated and SnO2-coated Y2SiO5:Ce thin film phosphors grown on Si (1 0 0) substrates by a pulsed laser deposition technique were characterized with scanning electron microscopy (SEM), atomic force microscopy (AFM), energy dispersive X-Ray analysis (

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::0be80f6ec002ba4f461514d6ea03e310
https://doi.org/10.1016/j.optmat.2006.06.009

Zobrazit plný text záznamu

Akademický článek

Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.

The Effect of N on the Segregation Kinetics of Mo in a Fe-3.5%Mo-N(100) Single Crystal Studied by Constant Temperature Heating Method

Autor: Christian Uebing, W.A. Jordaan, J. du Plessis, E.C. Viljoen

Publikováno v: Materials Science Forum. :461-464

The segregation kinetics of molybdenum in a nitrogen atmosphere was studied at temperatures between 773K and 873K. It was found that the rate of segregation of the molybdenum is only slightly enhanced by the presence of the nitrogen. The increase in

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::7e894fbd237b310950191ca8a0f99e40
https://doi.org/10.4028/www.scientific.net/msf.294-296.461

Zobrazit plný text záznamu

A dilute Cu(Ni) alloy for synthesis of large-area Bernal stacked bilayer graphene using atmospheric pressure chemical vapour deposition

Autor: Julien K. Dangbegnon, Moshawe J. Madito, Mopeli Fabiane, C.J. Oliphant, Farshad Barzegar, Abdulhakeem Bello, T.M. Masikhwa, Damilola Y. Momodu, W.A. Jordaan, Ncholu I. Manyala

Publikováno v: Journal of Applied Physics. 119:015306

A bilayer graphene film obtained on copper (Cu) foil is known to have a significant fraction of non-Bernal (AB) stacking and on copper/nickel (Cu/Ni) thin films is known to grow over a large-area with AB stacking. In this study, annealed Cu foils for

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::241b25c70a6a4da13ac29d5c82e8073e
https://doi.org/10.1063/1.4939648

Zobrazit plný text záznamu

Akademický článek

Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.

Vyhledávací nástroje:

Upřesnit hledání