Zobrazeno 1 - 10
of 18
pro vyhledávání: '"W. T. Beard"'
Publikováno v:
Il Nuovo Cimento D. 19:147-152
X-ray topographic measurements are reported for implantation and superstructure details in an otherwise perfect, parametric, single-crystal device. Image contrast in topographs is attributed to the combined effects of device implantation or depositio
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f8b0e1fa637b5455b551bef70338e3db
https://doi.org/10.1007/bf03040967
https://doi.org/10.1007/bf03040967
Publikováno v:
Advances in X-ray Analysis. 38:227-234
X-ray diffraction topography is the name given to several x-ray diffraction techniques where large area x-ray beams diffracted from a crystal provide detailed information about the surface structure and internal perfection of crystal microstructures.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d3ca4814445da2dd5608dd2597dfa5a2
https://doi.org/10.1154/s0376030800017833
https://doi.org/10.1154/s0376030800017833
Publikováno v:
Applied Physics Letters. 69:488-490
Measurements are reported for x‐ray diffraction topography (XRDT) images of implantation and superstructure details in an integrated circuit device investigated with the reflection method of line modified‐asymmetric crystal topography (LM‐ACT).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b26277c77b4e5668ea0d501b3e457048
https://doi.org/10.1063/1.117762
https://doi.org/10.1063/1.117762
Publikováno v:
Review of Progress in Quantitative Nondestructive Evaluation ISBN: 9781461371700
While quartz resonators have been the mainstay of the ultrasonics industry for some time, intricacies exist in the production of quality resonators and therefore fabrication remains somewhat of an art form. Recently the Johns Hopkins University Cente
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fe72fa7ac7d31569b7fd4f2d7b290ddb
https://doi.org/10.1007/978-1-4615-4791-4_266
https://doi.org/10.1007/978-1-4615-4791-4_266
Publikováno v:
Superlattices and Microstructures. 8:155-157
Photoreflectance (PR) experiments have been performed from 4.2 K to 300 K to study the temperature dependence of the internal electric fields in MBE grown n-type GaAs with various doping profiles. Franz-Keldysh oscillations (FKO) were observed in the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::036c570bce2e3cea9884c13b8ddf9dec
https://doi.org/10.1016/0749-6036(90)90081-h
https://doi.org/10.1016/0749-6036(90)90081-h
Publikováno v:
Advances in X-Ray Analysis ISBN: 9780306450457
X-ray diffraction topography is the name given to several x-ray diffraction techniques where large area x-ray beams diffracted from a crystal provide detailed information about the surface structure and internal perfection of crystal microstructures.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::60cacebcf5fc270db1169552ac063210
https://doi.org/10.1007/978-1-4615-1797-9_25
https://doi.org/10.1007/978-1-4615-1797-9_25
Publikováno v:
Proceedings of 1994 IEEE International Reliability Physics Symposium RELPHY-94.
X-ray diffraction topography is the name given to several X-ray diffraction techniques which permit the topography of planes within a crystal to be examined. The topographic techniques based on Bragg diffraction from a periodic crystal are extremely
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::455aabeca11fd7e5d103857d23b2949d
https://doi.org/10.1109/relphy.1994.307803
https://doi.org/10.1109/relphy.1994.307803
Autor:
D. R. Stone, W. T. Beard, Steven L. Wright, Thomas F. Kuech, Chien-Rong Lu, R. A. Wilson, J. R. Anderson
Publikováno v:
Physical review. B, Condensed matter. 43(14)
The temperature and doping-concentration dependence of the oscillatory properties in the photoreflectance (PR) spectra of GaAs grown by molecular-beam epitaxy has been studied in detail. The peak separation of the oscillatory part of the PR spectrum
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::45162109c51ea0449b965b1d271d19be
https://pubmed.ncbi.nlm.nih.gov/9996951
https://pubmed.ncbi.nlm.nih.gov/9996951
Autor:
Seyed Ahmad Tabatabaei, Y. J. Chen, Dennis Stone, W. T. Beard, Russell E. Frizzell, F.G. Johnson, S. Agarwala, G. A. Porkolab, Mario Dagenais, O. King
Publikováno v:
Scopus-Elsevier
Pyrolyzation of photolithographically patterned photoresist on semiconductor substrates such as silicon, gallium arsenide, and indium phosphide, results in a convex-shaped, chemically inert, temporary form that functions as a mold upon which to lift-
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2e2e6625d1ee41bf1a1b56aead31f3bf
https://doi.org/10.1116/1.589585
https://doi.org/10.1116/1.589585
Publikováno v:
Surface Science. 174:206-210
The temperature dependence of the photoreflectance spectra of multiple quantum wells has been measured. The low-temperature spectra show structure beyond what would be expected from a finite-well model. Not only are allowed and forbidden transitions
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::16b33af4a3de86b6f8de14579b293c0c
https://doi.org/10.1016/0039-6028(86)90409-7
https://doi.org/10.1016/0039-6028(86)90409-7