Zobrazeno 1 - 10
of 80
pro vyhledávání: '"W. Spirkl"'
Publikováno v:
Le Journal de Physique IV. :Pr3-117
An optical measurement for radiation concentrators is proposed. A Lambertian light source is placed in the exit aperture of the concentrator. By taking pictures of the concentrator as seen from a remote location one gets the transmission patterns whi
Publikováno v:
Le Journal de Physique IV. :Pr3-111
We present asymmetric secondary reflectors made of plane facets for increasing the concentration of radiation from a field of heliostats. The reflectors are suited for partitioning the receiver in several parallel units. In the case of an asymmetric
Autor:
A.D. Johnson, A. G. Cullis, A.M. Keir, Brian K. Tanner, W. Spirkl, B. Lunn, S. J. Barnett, G.F. Clark, T. Martin, W.E. Hagston, P. Ashu, C. R. Whitehouse, J.H. Jefferson, G. Lacey, J C H Hogg, G. W. Smith, Brian F. Usher
Publikováno v:
Journal of Crystal Growth. 150:85-91
The important value of the X-ray topography (XRT) technique for the investigation of III–V strained-layer relaxation processes is described. In addition to post-growth ex-situ XRT studies, a unique combined XRT/MBE growth facility has been construc
Autor:
A. D. Johnson, Brian K. Tanner, S. J. Barnett, G. W. Smith, J C H Hogg, B. Lunn, T. Martin, J.H. Jefferson, W.E. Hagston, G. Lacey, P. Ashu, C. M. Castelli, W. Spirkl, G.F. Clark, A. M. Keir, A. G. Cullis, C. R. Whitehouse
Publikováno v:
Journal of Physics D: Applied Physics. 28:A17-A22
We report results from a novel facility constructed to enable in situ X-ray diffraction studies during the molecular beam epitaxy growth of Ill-V strained layer device structures on 50 mm diameter substrates. This new facility, used in conjunction wi
Publikováno v:
Journal of Applied Physics. 77:2133-2137
Thin TiNxOy films were deposited on glass substrates in an activated reactive evaporation process. The influence of the reactive gas composition and pressure during deposition on the film density ρMass was investigated by grazing incidence x‐ray
Autor:
G.F. Clark, C. R. Hogg, S. J. Barnett, A. D. Johnson, W.E. Hagston, Brian F. Usher, C. R. Whitehouse, W. Spirkl, Brian K. Tanner, A. G. Cullis, B. Lunn, A. M. Keir
Publikováno v:
Philosophical Magazine A. 70:531-548
X-ray reflection topography for imaging misfit dislocations in highly strained systems with a small critical thickness is assessed. The samples often contain complex heterostructures such as capping layers, quantum wells or superlattices. For the fir
The use of parameter identification for flat-plate collector testing under non-stationary conditions
Publikováno v:
Renewable Energy. 4:217-222
A dynamic collector model for testing collectors and collector arrays under non-stationary operation is described. The aim of the model is to characterize the behaviour of a wide range of flat-plate collectors. The model takes explicitly into account
Autor:
C. R. Whitehouse, S. J. Barnett, Brian K. Tanner, W.E. Hagston, A. G. Cullis, B. Lunn, A. M. Keir, C. R. Hogg, A. D. Johnson, Brian F. Usher, G. E. Clark, W. Spirkl
Publikováno v:
Philosophical Magazine A. 69:221-236
Images of misfit dislocations as obtained from X-ray reflection topography with a low incidence angle are simulated. New algorithms for integrating numerically the Takagi–Taupin equations are presented with decoupled, variable and adaptively chosen
Autor:
W. Spirkl
Publikováno v:
Journal of Applied Physics. 74:1776-1780
A method for parameter identification in grazing incidence x‐ray reflectometry is presented. It is based on a nonlinear least‐squares approach with on‐line low‐pass filtering and fits the measured reflectivity curve as a function of the incid
Autor:
R. Sizmann, W. Spirkl
Publikováno v:
Journal of Applied Physics. 73:8601-8606
The actual performance of series‐connected photovoltaic multigap cells may substantially deviate from the design point performance. The influence of variations in cell temperature, solar irradiance, and its spectral distribution on thermodynamicall